A three-dimensional finite element model of near-field scanning microwave microscopy

Abstract

Enhanced microwave absorption in columnar structured magnetic materials J. Appl. Phys. 112, 083908 (2012) Terahertz emission from cubic semiconductor induced by a transient anisotropic photocurrent J. Appl. Phys. 112, 073115 (2012) Resonant plasmonic effects in periodic graphene antidot arrays Appl. Phys. Lett. 101, 151119 (2012) Room temperature terahertz polariton emitter Appl. Phys. Lett. 101, 141118 (2012) Optical parameters of ZnTe determined using continuous-wave terahertz radiation A three-dimensional finite element model of an experimental near-field scanning microwave microscope (NSMM) has been developed and compared to experiment on non conducting samples. The microwave reflection coefficient S 11 is calculated as a function of frequency with no adjustable parameters. There is qualitative agreement with experiment in that the resonant frequency can show a sizable increase with sample dielectric constant; a result that is not obtained with a two-dimensional model. The most realistic model shows a semi-quantitative agreement with experiment. The effect of different sample thicknesses and varying tip sample distances is investigated numerically and shown to effect NSMM performance in a way consistent with experiment. Visualization of the electric field indicates that the field is primarily determined by the shape of the coupling hooks. V C 2012 American Institute of Physics.

Quasistatics and electrodynamics of near-field microwave microscope

“…Here, we avoid the cumbersome expression for X E in the case of homogeneous half-space, that follows from the ED theory, 21 similarly to Eqs. (15) and (16). However, it is easily shown that once condition (1) is fulfilled, we will have X E % X Q without any further restrictions.…”

“…Quite popular is the approach based on solving the Maxwell or Poisson equations in the finiteelement method. 9,[14][15][16] Although this technique is used sometimes in dealing with the problems of diagnostics, a number of authors emphasize its being no good for routine applications, as it makes the calculation procedure extremely time-consuming. 16,17 It seems that most promise in this respect is shown by the analytical models of NFM, of which quite a few have been proposed to date.…”

“…9,[14][15][16] Although this technique is used sometimes in dealing with the problems of diagnostics, a number of authors emphasize its being no good for routine applications, as it makes the calculation procedure extremely time-consuming. 16,17 It seems that most promise in this respect is shown by the analytical models of NFM, of which quite a few have been proposed to date. Most of them use the quasistatic (QS) analysis 8,[17][18][19][20] justified by the condition…”

Резонансная Микроволновая Спектроскопия Полупроводников С Микронным Разрешением

“…В ряде работ исследования потенциальных возможностей БММ (разрешающей способности, чувствительности и пр.) производятся на основе компьютерного моделирования методами конечных элементов [45][46][47][48][49][50]. При этом используются собственные или коммерческие программы электромагнитной симуляции.…”

Traceable measurement and imaging of the complex permittivity of a multiphase mineral specimen at micron scales using a microwave microscope

“…The resonator and probe tip could instead be modelled using the Finite Element Method (FEM), which might in principle be more accurate for the conical tip. However, the large difference in scale between the resonator and the probe tip (for which very fine meshing is needed) limits the accuracy of FEM techniques [15].…”