Near-Field High-Frequency Probing

Paulson, C. A.; Weide, Daniel W. van der

doi:10.1007/978-0-387-28668-6_11

Cited by 4 publications

(1 citation statement)

References 157 publications

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“…Microwave probes can be configured as resonant or non-resonant structures [ 38 ]. A resonant configuration increases sensitivity but decreases measurement bandwidth [ 44 ]. Non-resonant configurations relate the changes in the magnitude and phase of the reflection or transmission coefficients to the physical changes of materials.…”

Section: Introductionmentioning

confidence: 99%

High-Resolution Detection of Rock-Forming Minerals by Permittivity Measurements with a Near-Field Scanning Microwave Microscope

Gutiérrez-Cano

Catalá-Civera

López-Buendía³

et al. 2022

Sensors

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The identification of the minerals composing rocks and their dielectric characterization is essential for the utilization of microwave energy in the rock industry. This paper describes the use of a near-field scanning microwave microscope with enhanced sensitivity for non-invasive measurements of permittivity maps of rock specimens at the micrometer scale in non-contact mode. The microwave system comprises a near-field probe, an in-house single-port vectorial reflectometer, and all circuitry and software needed to make a stand-alone, portable instrument. The relationship between the resonance parameters of the near-field probe and the dielectric properties of materials was determined by a combination of classical cavity perturbation theory and an image charge model. The accuracy of this approach was validated by a comparison study with reference materials. The device was employed to determine the permittivity maps of a couple of igneous rock specimens with low-loss and high-loss minerals. The dielectric results were correlated with the minerals comprising the samples and compared with the dielectric results reported in the literature, with excellent agreements.

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Section: Introductionmentioning

confidence: 99%

High-Resolution Detection of Rock-Forming Minerals by Permittivity Measurements with a Near-Field Scanning Microwave Microscope

Gutiérrez-Cano

Catalá-Civera

López-Buendía³

et al. 2022

Sensors

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show abstract

Scanning Probe Microscopy – Forces and Currents in the Nanoscale World

Rodriguez¹,

Proksch²,

Maksymovych³

et al. 2012

Handbook of Nanoscopy

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Scanning Near‐Field Microwave Microscopy of VO₂ and Chemical Vapor Deposition Graphene

Tselev

Lavrik

Kolmakov

et al. 2013

Adv Funct Materials

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Near‐field scanning microwave microscopy (SMM) is a near‐field technique, which enables probing local electric properties of materials, i.e., complex permittivity. Recently, this technique was incorporated into a commercially available atomic force microscope (AFM), providing a new powerful imaging mode in the suite of AFM techniques. AFM probe‐surface distance control allows routine acquisition of near‐field microwave images with a lateral resolution better than 100 nm, which was previously unattainable. In this paper, work performed with an AFM‐based SMM system at the Center for Nanophase Materials Sciences at ORNL is reviewed. As an introduction, a brief general overview of the near‐field microwave microscopy is provided followed by a description of the SMM system. Application of the technique to studies of metal‐insulator phase transition in single‐crystalline nanoplatelets of vanadium dioxide is illustrated. Further, the capabilities of SMM in its application to imaging of conductivity inhomogeneities in single‐ and few‐layer graphene samples grown via different chemical vapor deposition (CVD) routes is demonstrated. The imaging of graphene illustrates the specific nature of contrast in the SMM, where the signal is described by complex numbers. To facilitate the interpretation of the contrast, a simple graphical scheme inspired by standard Nyquist plots is proposed.

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Near-Field High-Frequency Probing

Cited by 4 publications

References 157 publications

High-Resolution Detection of Rock-Forming Minerals by Permittivity Measurements with a Near-Field Scanning Microwave Microscope

High-Resolution Detection of Rock-Forming Minerals by Permittivity Measurements with a Near-Field Scanning Microwave Microscope

Scanning Probe Microscopy – Forces and Currents in the Nanoscale World

Scanning Near‐Field Microwave Microscopy of VO₂ and Chemical Vapor Deposition Graphene

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Near-Field High-Frequency Probing

Cited by 4 publications

References 157 publications

High-Resolution Detection of Rock-Forming Minerals by Permittivity Measurements with a Near-Field Scanning Microwave Microscope

High-Resolution Detection of Rock-Forming Minerals by Permittivity Measurements with a Near-Field Scanning Microwave Microscope

Scanning Probe Microscopy – Forces and Currents in the Nanoscale World

Scanning Near‐Field Microwave Microscopy of VO2 and Chemical Vapor Deposition Graphene

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Product

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Scanning Near‐Field Microwave Microscopy of VO₂ and Chemical Vapor Deposition Graphene