Rational design of low-dimensional electronic phenomena at oxide interfaces is currently considered to be one of the most promising schemes for realizing new energy-efficient logic and memory devices. An atomically-abrupt interface between paramagnetic LaNiO 3 and antiferromagnetic CaMnO 3 exhibits interfacial ferromagnetism, which can be tuned via a thickness-dependent metal-insulator transition in LaNiO 3. Once fully understood, such emergent functionality could turn this archetypal Mott-interface system into a key building block for the above-mentioned future devices. Here, we use depth-resolved standing-wave photoemission spectroscopy in conjunction with scanning transmission electron microscopy and x-ray absorption spectroscopy, to demonstrate a depth-dependent charge reconstruction at the LaNiO 3 /CaMnO 3 interface. Our measurements reveal an increased concentration of Mn 3+ and Ni 2+ cations at the interface, which create an electronic environment favourable for the emergence of interfacial ferromagnetism mediated via the Mn 4+-Mn 3+ ferromagnetic double exchange and Ni 2+-O-Mn 4+ superexchange mechanisms. Our findings suggest a new strategy for designing functional Mott oxide heterostructures by tuning the interfacial cation characteristics via controlled manipulation of thickness, strain, and ionic defect states. by tuning the thickness of the LaNiO layer, which undergoes a metal-insulator transition in the ultrathin limit (<4 u.c.), resulting in the thickness-dependent controllability of the magnetic moment at the interface as demonstrated in a prior study [15].