NASA Goddard Space Flight Center’s Compendium of Total Ionizing Dose, Displacement Damage Dose, and Single-Event Effects Test Results

Topper, Alvson D.; Wyrwas, Edward J.; Ryder, Kaitlyn L.; LaBel, Kenneth A.; Pellish, Jonathan A.; Majewicz, Peter J.; Cochran, Donna J.; O'Bryan, Martha V.; Casey, Megan C.; Lauenstein, Jean-Marie; Stansberry, Scott D.; Campola, Michael J.; Wilcox, Edward P.; Ladbury, Ray; Berg, Melanie D.

doi:10.1109/redw.2019.8906647

Cited by 4 publications

(2 citation statements)

References 2 publications

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“…Testing on power MOSFETs indicates varying levels of resistance to TID, SEB, and SEGR [140]. Results from [103] reveal further details about the hardness to radiation of trench power MOSFETs, which exhibit SEBs with variation in failure thresholds even between identical parts.…”

Section: Fetsmentioning

confidence: 91%

COTS Devices for Space Missions in LEO

Brunetti,

Campiti,

Tagliente

et al. 2024

IEEE Access

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In the framework of the NewSpace revolution, time-to-market and budget constraints drive the development of small and medium-sized satellites in Low Earth Orbit (LEO) orbit. The adoption of Commercial Off-the-Shelf (COTS) components represents the current trend to fulfill the NewSpace goals, given their low cost, wide product availability, small time-to-market, and the ability to integrate the most recent advancements in space applications. However, migrating from radiation-hardened (rad-hard) devices to COTS ones requires ensuring comparable reliability levels. To this end, an "upscreening" of the COTS devices and systems should be performed in compliance with widely adopted standard regulations, such as those used by ESA or NASA. In this paper, we review COTS components and systems, such as diodes, Bipolar Junction Transistors (BJTs), Field Effect Transistors (FETs), Operational Amplifiers (OPAMPs), memories, and Field Programmable Gate Arrays (FPGAs), proven-flight or ad-hoc tested for compliance with standard regulations. In conclusion, the most promising devices in terms of cost and radiation tolerances are identified, providing useful benchmarks for space engineers developing COTS-based innovative systems.

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Section: Fetsmentioning

confidence: 91%

COTS Devices for Space Missions in LEO

Brunetti,

Campiti,

Tagliente

et al. 2024

IEEE Access

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“…The MBT2222 (dual NPN) from ON Semiconductor and MMBT2907 (single PNP) from Diodes Incorporated were chosen based on total ionizing dose (TID) performance of at least 10 krad accumulated dose before parameters deviated beyond manufacturer specification [20], [21]. A dual N-channel MOSFET, BSS138, also manufactured by Diodes Incorporated, was chosen based on the demonstrated TID tolerances [22] and heavy ion performance [23] for the BSS1xx family of power MOSFETs.…”

Section: Hardware Implementation and Characterizationmentioning

confidence: 99%

On-Orbit Implementation of Discrete Isolation Schemes for Improved Reliability of Serial Communication Buses

Holliday

Manchester

Senesky

2022

IEEE Trans. Aerosp. Electron. Syst.

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Serial communication buses are used in electronic systems to interconnect sensors and other devices, but two of the most widely used protocols, I 2 C and SPI, are vulnerable to bus-wide failures if even one device on the bus malfunctions. For aerospace applications demanding increasingly more distributed processing and sensing capability, the compounding risk to system reliability as device count scales becomes a limiting factor in mission scope, performance, and lifetime. We propose a simple external circuit to be added to each node on a communication bus that automatically isolates the node in the event of device failure. By automatically isolating failed devices, the integrity of the bus is preserved without requiring additional signals or processing overhead from the host controller. In this article, I 2 C and SPI isolation circuits are simulated, fabricated, and experimentally verified to be effective at preserving bus integrity in the event of peripheral device failure. Generalized reusable circuit blocks were designed and integrated into three spacecraft systems for the successful NASA V-R3x mission deployed in January 2021. The addition of serial bus isolation significantly improved system reliability for the V-R3x mission by eliminating singlepoint failure modes of the I 2 C and SPI buses interconnecting sensors and radios necessary for mission success. The developed protection schemes are a valuable tool for decoupling system reliability from serial bus device count and can readily be integrated into existing aerospace systems.

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Artificial Neural Networks for Space and Safety-Critical Applications: Reliability Issues and Potential Solutions

Rech

2024

IEEE Trans. Nucl. Sci.

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Machine Learning is among the greatest advancements in computer science and engineering and is today used to classify or detect objects, a key feature in autonomous vehicles. Since neural networks are heavily used in safety-critical applications, such as automotive and aerospace, their reliability must be paramount. However, the reliability evaluation of neural network systems is extremely challenging due to the complexity of the software, which is composed of hundreds of layers, and of the underlying hardware, typically a parallel device or an embedded accelerator.This paper reviews fundamental concepts of Artificial Intelligence, Deep Neural Network, and parallel computing device reliability. Then, the reliability studies that consider the radiation effects in the hardware, their propagation through the computing architecture, and their final impact on the software output are summarized. A detailed survey of the available strategies to measure the sensitivity of neural network frameworks and to observe fault propagation is given, together with a summary of the data obtained so far. Finally, a discussion on how to use the experimental evaluation to design effective and efficient hardening solutions for Artificial Neural Networks is provided. The available hardening solutions are critically reviewed, highlighting their benefits and drawbacks.

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NASA Goddard Space Flight Center’s Compendium of Total Ionizing Dose, Displacement Damage Dose, and Single-Event Effects Test Results

Cited by 4 publications

References 2 publications

COTS Devices for Space Missions in LEO

COTS Devices for Space Missions in LEO

On-Orbit Implementation of Discrete Isolation Schemes for Improved Reliability of Serial Communication Buses

Artificial Neural Networks for Space and Safety-Critical Applications: Reliability Issues and Potential Solutions

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