2011
DOI: 10.1016/j.jcrysgro.2010.08.010
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Narrow band gap GaInNAsSb material grown by metal organic vapor phase epitaxy (MOVPE) for solar cell applications

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Cited by 23 publications
(11 citation statements)
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“…Compared to prior reports for films grown at lower temperatures (15-113 cm À 2 /V s), these mobility values (i.e. larger than 100 cm À 2 /V s) are improved [23]. The lower carrier concentration and reduced impurity scattering may be responsible for the higher mobilities observed here.…”
Section: N Incorporation In Gaasn Ingaasn and Gaassbn Filmscontrasting
confidence: 73%
See 1 more Smart Citation
“…Compared to prior reports for films grown at lower temperatures (15-113 cm À 2 /V s), these mobility values (i.e. larger than 100 cm À 2 /V s) are improved [23]. The lower carrier concentration and reduced impurity scattering may be responsible for the higher mobilities observed here.…”
Section: N Incorporation In Gaasn Ingaasn and Gaassbn Filmscontrasting
confidence: 73%
“…Bulk GaAsSbN films grown at higher growth temperature were observed to exhibit reduced background carbon contamination [9]. For InGaAsN grown at 600 1C, the background hole carrier concentration is 1 À 2 Â 10 17 cm À 3 , which is two orders of magnitude lower than previously reported for films grown at 525 1C [23]. After post-growth annealing, all of the dilute-nitride materials reported here exhibit hole carrier concentrations in the range of 0.96 À 5.20 Â 10 17 cm À 3 and the mobilities are in the range of 100-250 cm À 2 /V s (Fig.…”
Section: N Incorporation In Gaasn Ingaasn and Gaassbn Filmsmentioning
confidence: 62%
“…Dilute-nitride materials, such as InGaAsN, InGaAsSbN, and GaAsSbN, grown by MOVPE suffer from an unintentionally high background carbon concentration [7], [11], [12], making it difficult to control n-type compensation doping for realizing a homojunction solar cell structure. We previously reported that the unintentional carbon background doping of GaAsSbN could be minimized by higher growth temperatures and through the use of alternative gallium and antimony MO sources [7].…”
Section: Resultsmentioning
confidence: 99%
“…Dilute nitride samples were grown by the University of Wisconsin at Madison (UW-M) using a vertical chamber MOVPE reactor with a close-coupled showerhead gas delivery system as previously described [7]. Trimethylindium (TMIn) and trimethylgallium (TMGa) were used as group III precursors, tertiary butyl arsine (TBAs) and dimethylhydrazine (DMHy) were used as As and N sources, and trimethylantimony (TMSb) was used as an Sb precursor.…”
Section: Movpementioning
confidence: 99%