2010
DOI: 10.1038/nnano.2010.15
|View full text |Cite
|
Sign up to set email alerts
|

Nanowire transistors without junctions

Abstract: All existing transistors are based on the use of semiconductor junctions formed by introducing dopant atoms into the semiconductor material. As the distance between junctions in modern devices drops below 10 nm, extraordinarily high doping concentration gradients become necessary. Because of the laws of diffusion and the statistical nature of the distribution of the doping atoms, such junctions represent an increasingly difficult fabrication challenge for the semiconductor industry. Here, we propose and demons… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
1
1

Citation Types

19
943
1
19

Year Published

2010
2010
2019
2019

Publication Types

Select...
5
5

Relationship

1
9

Authors

Journals

citations
Cited by 2,143 publications
(1,023 citation statements)
references
References 13 publications
19
943
1
19
Order By: Relevance
“…However, work must continue into applications of the MLD process on new device architectures such as junction-less transistors and gate-all-around transistors. [65,66] Aside from microelectronics, the MLD process has also been successfully applied with great success to solar cell materials and optoelectronic materials. Concurrently, there is a need for innovative improvements to metrological techniques to be made in order for the ultra-shallow junctions to be characterised to ensure conformality and abruptness.…”
Section: Discussionmentioning
confidence: 99%
“…However, work must continue into applications of the MLD process on new device architectures such as junction-less transistors and gate-all-around transistors. [65,66] Aside from microelectronics, the MLD process has also been successfully applied with great success to solar cell materials and optoelectronic materials. Concurrently, there is a need for innovative improvements to metrological techniques to be made in order for the ultra-shallow junctions to be characterised to ensure conformality and abruptness.…”
Section: Discussionmentioning
confidence: 99%
“…The mechanism of the leakage current is discussed using the activation energy (E A The junctionless (JL) metal-oxide-semiconductor fieldeffect transistor (MOSFET) has been recently introduced and is a promising candidate for end-of-roadmap complementary metal-oxide-semiconductor (CMOS) circuit fabrication. 1,2 In a JL transistor, the doping concentration is constant through the source, and channel and drain are doped. Typical doping concentration is in the range of few 10 19 cm À3 .…”
mentioning
confidence: 99%
“…To overcome the technological difficulties in the formation of ultra-sharp S/D extension regions in nanoscale devices, the concept of the junctionless (JL) MOS transistor in silicon-on-insulator (SOI) and bulk technologies has been recently reported [1][2][3]. The JL transistor is an MOS device where the channel doping is the same as that of heavily doped S/D regions.…”
Section: Junctionless 6t Sram Cellmentioning
confidence: 99%