2007
DOI: 10.1016/j.tsf.2006.12.014
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Nanostructured CeO2 thin films: A SAXS study of the interface between grains and pores

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Cited by 10 publications
(10 citation statements)
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“…Cyclic voltammetry experiments were carried out in a conventional three-electrode electrochemical cell with 1 M LiClO 4 /PC electrolyte where a platinum wire and a silver wire were used as a counter and reference electrode, respectively. These values were compatible with the literature for one-layer air deposited films [16][17][18][19][20][21][22][23][24][25][26][27][28][29][30]. 4.…”
Section: Resultssupporting
confidence: 89%
See 1 more Smart Citation
“…Cyclic voltammetry experiments were carried out in a conventional three-electrode electrochemical cell with 1 M LiClO 4 /PC electrolyte where a platinum wire and a silver wire were used as a counter and reference electrode, respectively. These values were compatible with the literature for one-layer air deposited films [16][17][18][19][20][21][22][23][24][25][26][27][28][29][30]. 4.…”
Section: Resultssupporting
confidence: 89%
“…1. Ce-OH bond is present in the wave number region of 3200-3300 while in plane bending of water molecule is observed at 1587 cm À 1 [16][17][18]. First weight loss (%6.6) of the powder appeared nearly at 60 1C, assigned to desorption of physically adsorbed water and/or organic solvent the other peaks were nearly placed at 180 1C, 205 1C and 305 1C.…”
Section: Resultsmentioning
confidence: 99%
“…However, there are few reports focused on controlling oxygen vacancies by annealing treatment in nanocrystalline CeO 2 films. CeO 2 thin films have been prepared by many methods such as pulsed laser deposition [17], sol-gel [18], electro-deposition [19], chemical vapor deposition [20], ion beam assisted deposition [21] and radio-frequency magnetron sputtering [22].…”
Section: Page 4 Of 22mentioning
confidence: 99%
“…In XRD measurements (12) the crystallite or grain size of these films was estimated using the Scherrer equation where λ is the X-ray wavelength, θ is the Bragg angle and β is the pure full width of the diffraction line at half of the maximum intensity. Cerium based films were investigated as well as with 2D-GISAXS measurements at synchrotron ELETTRA (13)(14)(15).…”
Section: Ecs Transactions 19 (27) 153-161 (2009)mentioning
confidence: 99%