Nanosensitive Silicon Microprobes for Mechanical Detection and Measurements

Łysko, J.; Dumania, P.; Janus, P.; Grodner, M.; Kłos, Helena; Skwara, Karina; Grabiec, P.

doi:10.4236/msa.2011.26078

Cited by 3 publications

(2 citation statements)

References 7 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…5) were developed and successfully tested. Nanosensitive mechanical microprobes with CMOS transistors, inverters, inverter cascades and ring oscillators were presented by Łysko et al [49]. As some of developed transistors were located in the area of the highest tension of the probes, the piezoresistive effect caused the changes of the resistance of the channels.…”

Section: The Probe's Deflection Detection Systemsmentioning

confidence: 99%

Quantitative Normal Force Measurements by Means of Atomic Force Microscopy Towards the Accurate and Easy Spring Constant Determination

Sikora¹

2016

NSNM

View full text Add to dashboard Cite

Due to its rapid popularity increase within last three decades, with particular focus on submicrometer quantitative surface's properties imaging, atomic force microscopy (AFM) is still a subject of development and research in terms of both better understanding and efficient utilization of various measurement techniques. Quantitative and comparable measurements at nanoscale are a significant issue, as both: science and industry desire reliable results, allowing to perform repetitive experiments at any time and location. Therefore a numerous analysis and research projects were carried out to provide metrological approach for those techniques in terms of providing the traceability and the uncertainty estimation. In this paper an overview of various methods and approaches towards quantitative determination of the normal spring constant of the AFM probes is presented.

show abstract

Section: The Probe's Deflection Detection Systemsmentioning

confidence: 99%

Quantitative Normal Force Measurements by Means of Atomic Force Microscopy Towards the Accurate and Easy Spring Constant Determination

Sikora¹

2016

NSNM

View full text Add to dashboard Cite

show abstract

“…At present, the standard methods of the nanometer-scale detection of strain are based on micrometer size silicon piezoresistors or MOS transistors with piezoresistive channels [49]. Recently, a strain sensor based on commensurate-incommensurate phase transition in the double-walled CNTs was proposed [2].…”

Section: Strain Sensor Based On Zigzag Cntmentioning

confidence: 99%

Structural phase transition and band gap of uniaxially deformed (6,0) carbon nanotube

Poklonski¹,

Ratkevich²,

Вырко³

et al. 2012

Chemical Physics Letters

View full text Add to dashboard Cite

The atomic and band structures of the (6, 0) zigzag carbon nanotube at its axial elongation are calculated by semiempirical molecular orbital and by tight-binding methods. The ground state of the nanotube is found to have a Kekule structure with four types of bonds and difference between lengths of long and short bonds of about 0.005 nm. The structural phase transition is revealed at ≈ 9% elongation, resulting in a quinoid structure with two types of bonds. This structural phase transition is followed by the transition from a narrow gap to moderate gap semiconductor. Validity of the semiempirical PM3 method is discussed.

show abstract

Fabrication and characterization of electromagnetically actuated microcantilevers for biochemical sensing, parallel AFM and nanomanipulation

Nieradka¹,

Kopiec²,

MałOzić³

et al. 2012

Microelectronic Engineering

View full text Add to dashboard Cite

Nanosensitive Silicon Microprobes for Mechanical Detection and Measurements

Abstract: ABSTRACT

Cited by 3 publications

References 7 publications

Quantitative Normal Force Measurements by Means of Atomic Force Microscopy Towards the Accurate and Easy Spring Constant Determination

Quantitative Normal Force Measurements by Means of Atomic Force Microscopy Towards the Accurate and Easy Spring Constant Determination

Structural phase transition and band gap of uniaxially deformed (6,0) carbon nanotube

Fabrication and characterization of electromagnetically actuated microcantilevers for biochemical sensing, parallel AFM and nanomanipulation

Contact Info

Product

Resources

About