Nanosecond pulse laser melting investigation by IR radiometry and reflection-based methods

Martan, J.; Cibulka, Ondřej; Semmar, Nadjib

doi:10.1016/j.apsusc.2006.01.077

Cited by 40 publications

(29 citation statements)

References 15 publications

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“…5, is specific for silicon and not present for metallic samples. It is caused by changes in the optical behavior of silicon with phase change as described in [16]. Oscillations at the beginning of the plateau are perturbations produced by the IR detector after a fast change in the IR signal.…”

Section: Liquid-phase Emissivitymentioning

confidence: 99%

“…The present surface temperature measurement system was also used in investigations of nanosecond laser melting [16]. During cooling after the laser pulse, a solidification plateau appears at the end of the solidification of the liquid phase.…”

Section: Liquid-phase Emissivitymentioning

confidence: 99%

“…The chemical compositions of the samples can be found in previous reports [14][15][16]. The Si sample was a monocrystalline wafer with orientation (100) and a thickness of 575 µm, and a 50 µm thick surface layer doped with P. The metallic samples were mechanically polished.…”

Section: Experimental Systemmentioning

confidence: 99%

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IR Radiometry Optical System View Factor and Its Application to Emissivity Investigations of Solid and Liquid Phases

2007

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An optical system for fast IR radiometry designed for investigations of thin film thermal properties and pulsed laser melting was analyzed in this work. A methodology for determination of the view factor from calibration measurements was developed. The view factor (0.0255) of the optical system containing two paraboloid mirrors was determined experimentally from calibration measurements on pure metals and metallic alloys. The knowledge of the view factor was then applied to normal emissivity investigations at IR wavelengths. The emissivity of tungsten films prepared by magnetron sputtering was determined for different deposition conditions, varying between 0.036 and 0.071. Liquid phase emissivities of Cu, Mo, Ni, Si, Sn, Ti, and steel were also determined and were found to be higher than solid-state emissivities as predicted from the literature. A knowledge of the liquid-state emissivity of silicon enabled recalculation of the IR signal evolution to the temperature evolution, during and after a nanosecond laser pulse. This was not possible by use of the usual calibration because of silicon's semi-transparent behavior in the IR range (1-10 µm) in the solidstate phase.

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Section: Liquid-phase Emissivitymentioning

confidence: 99%

Section: Liquid-phase Emissivitymentioning

confidence: 99%

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IR Radiometry Optical System View Factor and Its Application to Emissivity Investigations of Solid and Liquid Phases

2007

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“…Phase and/or structural changes are detected by means of the time-resolved reflectivity (TRR) method. This optical method was earlier used to investigate semiconductor materials during laser thermal processing [5][6][7][8][9]. The pulsed laser heats the sample and induces temperature rise, phase, morphological or other changes on its surface.…”

Section: Introductionmentioning

confidence: 99%

Direct observation of phase transitions by time-resolved pyro/reflectometry of KrF laser-irradiated metal oxides and metals

Semmar

Tebib

Tesař

et al. 2009

Applied Surface Science

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“…Each pulse results in melting followed by damped oscillations of the melted surface due to the forces of surface tension and viscosity. If the oscillations damp out within the time that the surface is molten, a smoother surface will result upon solidification [16,17]. Analytical models were proposed to describe the dynamics of the melt pool [10][11][12].…”

Section: Introductionmentioning

confidence: 99%

Pulsed laser micro polishing: Surface prediction model

Vadali

Duffie

et al. 2012

Journal of Manufacturing Processes

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This project is focused on developing physics-based models to predict the outcome of pulsed laser micro polishing (PLµP). Perry et al. [1][2][3] have modeled PLµP as oscillations of capillary waves with damping resulting from the forces of surface tension and viscosity and a one-dimensional spatial frequency domain analysis was proposed. They have also proposed a critical spatial frequency, f cr , above which a significant reduction in the amplitude of the spatial Fourier components is expected. The current work extends the concept of critical frequency to two dimensional spatial frequency analysis of PLµP. We propose a physics-based prediction methodology to predict the spatial frequency content and surface roughness after polishing, given the features of the original surface, the material properties, and laser parameters used for PLµP.The proposed prediction methodology was tested using PLµP line polishing data for stainless steel 316L and area polishing results for pure Nickel, Ti6Al4V, and Al-6061-T6. The predicted average surface roughnesses were within 10% to 12% of the values measured on the polished surfaces. The results show that the critical frequency continues to be a useful predictor of polishing results in the 2-D spatial frequency domain. The laser processing parameters, as represented by the critical frequency, and the initial surface texture can be used to predict the final surface roughness before actually implementing PLµP.

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Nanosecond pulse laser melting investigation by IR radiometry and reflection-based methods

Cited by 40 publications

References 15 publications

IR Radiometry Optical System View Factor and Its Application to Emissivity Investigations of Solid and Liquid Phases

IR Radiometry Optical System View Factor and Its Application to Emissivity Investigations of Solid and Liquid Phases

Direct observation of phase transitions by time-resolved pyro/reflectometry of KrF laser-irradiated metal oxides and metals

Pulsed laser micro polishing: Surface prediction model

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