Nanoscale Visualization and Control of Ferroelectric Domains by Atomic Force Microscopy

Kolosov, Oleg; Gruverman, Alexei; Hatano, Jun; Takahashi, Koichiro; Tokumoto, Hiroshi

doi:10.1103/physrevlett.74.4309

Cited by 237 publications

(128 citation statements)

References 15 publications

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“…Unipolar rectangular and bipolar triangular pulses with amplitude U sw ¼ 20-100 V and duration t sw ¼ 50-250 ms were applied to the tip. Resulted domain structures were visualized in single frequency and band excitation piezoresponse force microscopy (PFM) modes [33][34][35] . All SPM images of the domains in this study are presented in the combined piezoresponse signal: PR ¼ R Â sin(y), where R and y are the amplitude and phase of piezoresponse, respectively.…”

Section: Resultsmentioning

confidence: 99%

Ionic field effect and memristive phenomena in single-point ferroelectric domain switching

et al. 2014

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Electric field-induced polarization switching underpins most functional applications of ferroelectric materials in information technology, materials science and optoelectronics. Recently, much attention has been focused on the switching of individual domains using scanning probe microscopy. The classical picture of tip-induced switching, including formation of cylindrical domains with size, is largely determined by the field distribution and domain wall motion kinetics. The polarization screening is recognized as a necessary precondition to the stability of ferroelectric phase; however, screening processes are generally considered to be uniformly efficient and not leading to changes in switching behaviour. Here we demonstrate that single-point tip-induced polarization switching can give rise to a surprisingly broad range of domain morphologies, including radial and angular instabilities. These behaviours are traced to the surface screening charge dynamics, which in some cases can even give rise to anomalous switching against the electric field (ionic field effect).

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Section: Resultsmentioning

confidence: 99%

Ionic field effect and memristive phenomena in single-point ferroelectric domain switching

et al. 2014

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“…32 Such a difference results in a contrast in the d 33 piezoelectric coefficient, which can be retrieved by vertical PFM measurements on z-cut substrates, 18,19 to afford local and non-destructive visualizations of PE areas.…”

Section: Methodsmentioning

confidence: 99%

“…18,19 Furthermore, it can enable 3D reconstruction of the spontaneous polarization by combining vertical and lateral PFM, 20 estimation of piezoelectric coefficients, 21 and nanoscale characterization of ferroic samples with proton in-diffusion. 16,22 In this work, we present a coherent study on selectively proton-exchanged LN substrates, demonstrating the viability of a PFM approach for non-destructive high-resolution imaging of the PE regions.…”

Section: Introductionmentioning

confidence: 99%

Nanoscale characterization of β-phase HxLi1−xNbO3 layers by piezoresponse force microscopy

Manzo

Denning

Rodriguez

et al. 2014

Journal of Applied Physics

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We investigate a non-destructive approach for the characterization of proton exchanged layers in LiNbO 3 with sub-micrometric resolution by means of piezoresponse force microscopy (PFM). Through systematic analyses, we identify a clear correlation between optical measurements on the extraordinary refractive index and PFM measurements on the piezoelectric d 33 coefficient. Furthermore, we quantify the reduction of the latter induced by proton exchange as 83 6 2% and 68 6 3% of the LiNbO 3 value, for undoped and 5 mol. % MgO-doped substrates, respectively. V C 2014 AIP Publishing LLC. [http://dx

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“…The development of such probes can be roughly divided into the pre-1995 period and post-1995 period, as demarcated by the nearly simultaneous introduction of Piezoresponse Force Microscopy and (essentially similar) scanning probe microscopy methods by Kolosov and Gruverman, 41 Eng, 42 Takata, 40 Franke 43,44 and later Khim. 45 Prior to 1995, the methods for ferroelectric domain imaging were based on the then preponderant optical 46 and electron microscopy methods.…”

Section: Iia Basic Pfmmentioning

confidence: 99%

Ferroelectric or non-ferroelectric: Why so many materials exhibit “ferroelectricity” on the nanoscale

Vasudevan

Balke

Maksymovych

et al. 2017

Applied Physics Reviews

264

206

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Ferroelectric materials have remained one of the foci of condensed matter physics and materials science for over 50 years. In the last 20 years, the development of voltage-modulated scanning probe microscopy techniques, exemplified by Piezoresponse force microscopy (PFM) and associated time-and voltage spectroscopies, opened a pathway to explore these materials on a single-digit nanometer level. Consequently, domain structures, walls and polarization dynamics can now be imaged in real space. More generally, PFM has allowed studying electromechanical coupling in a broad variety of materials ranging from ionics to biological systems. It can also be anticipated that the recent Nobel prize 1 in molecular electromechanical machines will result in rapid growth in interest in PFM as a method to probe their behavior on single device and device assembly levels. However, the broad introduction of PFM also resulted in a growing number of reports on nearly-ubiquitous presence of ferroelectric-like phenomena including remnant polar states and electromechanical hysteresis loops in materials which are non-ferroelectric in the bulk, or in cases where size effects are expected to suppress ferroelectricity. While in certain cases plausible physical mechanisms can be suggested, there is remarkable similarity in observed behaviors, irrespective of the materials system. In this review, we summarize the basic principles of PFM, briefly discuss the features of ferroelectric surfaces salient to PFM imaging and spectroscopy, and summarize existing reports on ferroelectric-like responses in non-classical ferroelectric materials. We further discuss possible mechanisms behind observed behaviors, and possible experimental strategies for their identification.3

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Nanoscale Visualization and Control of Ferroelectric Domains by Atomic Force Microscopy

Cited by 237 publications

References 15 publications

Ionic field effect and memristive phenomena in single-point ferroelectric domain switching

Ionic field effect and memristive phenomena in single-point ferroelectric domain switching

Nanoscale characterization of β-phase HxLi1−xNbO3 layers by piezoresponse force microscopy

Ferroelectric or non-ferroelectric: Why so many materials exhibit “ferroelectricity” on the nanoscale

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