Nanoscale Characterization of Surfaces and Interfaces

DiNardo, N. J.

doi:10.1002/9783527603978.mst0020

Cited by 3 publications

(5 citation statements)

References 350 publications

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“…AFM, used to determine the elastic properties of electrospun membranes, consists of a cantilever and tip assembly. Atomic resolution can be obtained with very slight contact by measuring the deflection of the cantilever due to the repulsion of contacting atomic shells of the tip and the sample [109]. AFM Phase Imaging being an extension of tapping mode allows detection of variations in composition and hardness [110].…”

Section: Mechanical Characterizationmentioning

confidence: 99%

A review on fabrication of nanofibers via electrospinning and their applications

et al. 2019

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In the history of modern science, nanotechnology accomplished the most attraction by the researchers as nanomaterials exhibit novel and significantly improved properties in term of physical, chemical, and biological properties and they can be modified accordingly. These are mainly because there is an increase in surface area as compared to volume as particles get smaller. Electrospinning is one of the most suitable method for producing continuous nanomaterials with varying physical, chemical and biological properties. In this review paper we discussed the theory and the experimental setup of electrospinning along with the history of this process. We also review on the effect of parameters (solution, processing and ambient) on the fiber morphology and the potential applications of electrospun nanofibers. This is followed by geometrical, chemical, physical and mechanical characterization procedure of electrospun nanofiber.

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Section: Mechanical Characterizationmentioning

confidence: 99%

A review on fabrication of nanofibers via electrospinning and their applications

et al. 2019

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“…The phase signal is related to the energy dissipated by the tapping tip while scanning the surface, and gives information at the nanometric scale about the size and the shape of local rubber heterogeneities, identifying regions with different stiffness [51][52] . The phase signal is related to the energy dissipated by the tapping tip while scanning the surface, and gives information at the nanometric scale about the size and the shape of local rubber heterogeneities, identifying regions with different stiffness [51][52] .…”

Section: Tem and Afm Morphological Analysismentioning

confidence: 99%

The filler–rubber interface in styrene butadiene nanocomposites with anisotropic silica particles: morphology and dynamic properties

et al. 2015

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Silica-styrene butadiene rubber (SBR) nanocomposites were prepared by using shape-controlled spherical and rod-like silica nanoparticles (NPs) with different aspect ratios (AR = 1-5), obtained by a sol-gel route assisted by a structure directing agent. The nanocomposites were used as models to study the influence of the particle shape on the formation of nanoscale immobilized rubber at the silica-rubber interface and its effect on the dynamic-mechanical behavior. TEM and AFM tapping mode analyses of nanocomposites demonstrated that the silica particles are surrounded by a rubber layer immobilized at the particle surface. The spherical filler showed small contact zones between neighboring particles in contact with thin rubber layers, while anisotropic particles (AR > 2) formed domains of rods preferentially aligned along the main axis. A detailed analysis of the polymer chain mobility by different time domain nuclear magnetic resonance (TD-NMR) techniques evidenced a population of rigid rubber chains surrounding particles, whose amount increases with the particle anisotropy, even in the absence of significant differences in terms of chemical crosslinking. Dynamic measurements demonstrate that rod-like particles induce stronger reinforcement of rubber, increasing with the AR. This was related to the self-alignment of the anisotropic silica particles in domains able to immobilize rubber.

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“…However, since the goal of the present study is to elucidate the origins and nature of highly localized corrosion associated with fingerprint residue on metallic surfaces, the requirement is a means of imaging at much higher resolution, typically 1 μm or less. The technique selected for this purpose is the AFM (5–7), which has been shown to be capable of providing topographic images of a wide range of surfaces with vertical and lateral resolutions of <10 nm. For the instrument used in the present study (see below), this capability was exploited within a typical lateral footprint (total image size) of 100 μm × 100 μm, and a maximum travel (vertical range) of 9 μm.…”

Section: Methodsmentioning

confidence: 99%

“…The AFM technique involves holding a finely etched tip (typical radius of curvature 10 nm; Veeco model RTESP part # MPP‐11100‐10; operating frequency 250–350 kHz and spring constant 20–80 N m −1 , dependent on conditions) mounted on a sensitive cantilever in close proximity to the surface of the sample and measuring the interaction force between the tip and sample surface as a function of lateral position. The distance between the sample surface and the tip is uniquely defined by the interaction force, which is measured optically and converted into a topographic map (5–7). Since this interaction is not determined by sample conductivity, the AFM will image both exposed metal areas of the sample and areas coated with fingerprint residue.…”

Section: Methodsmentioning

confidence: 99%

“…This study sets out to address the first of these questions—the answers to which should be the prerequisites for addressing the remaining issues—for the specific case of brass substrates, which are relevant to a range of items, notably bullet casings. This is accomplished using a high resolution imaging device, the Atomic Force Microscope (AFM), which has found wide applicability in characterizing diverse metallic (2), polymer (3), and organic (4) surfaces and is now widely exploited in interfacial science (5–7).…”

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confidence: 99%

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High Resolution Imaging of Latent Fingerprints by Localized Corrosion on Brass Surfaces

Goddard

Hillman

Bond

2010

Journal of Forensic Sciences

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The Atomic Force Microscope (AFM) is capable of imaging fingerprint ridges on polished brass substrates at an unprecedented level of detail. While exposure to elevated humidity at ambient or slightly raised temperatures does not change the image appreciably, subsequent brief heating in a flame results in complete loss of the sweat deposit and the appearance of pits and trenches. Localized elemental analysis (using EDAX, coupled with SEM imaging) shows the presence of the constituents of salt in the initial deposits. Together with water and atmospheric oxygen--and with thermal enhancement--these are capable of driving a surface corrosion process. This process is sufficiently localized that it has the potential to generate a durable negative topographical image of the fingerprint. AFM examination of surface regions between ridges revealed small deposits (probably microscopic "spatter" of sweat components or transferred particulates) that may ultimately limit the level of ridge detail analysis.

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Nanoscale Characterization of Surfaces and Interfaces

Cited by 3 publications

References 350 publications

A review on fabrication of nanofibers via electrospinning and their applications

A review on fabrication of nanofibers via electrospinning and their applications

The filler–rubber interface in styrene butadiene nanocomposites with anisotropic silica particles: morphology and dynamic properties

High Resolution Imaging of Latent Fingerprints by Localized Corrosion on Brass Surfaces

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