2012
DOI: 10.1016/j.nimb.2011.12.045
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Nanometric transformation of the matter by short and intense electronic excitation: Experimental data versus inelastic thermal spike model

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Cited by 141 publications
(125 citation statements)
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“…The passage of a swift heavy ion (SHI) through a solid material can result in permanent damage along the ion's trajectory and is commonly called an ion track [12,13,[23][24][25]. The most common description of the ion track formation, the thermal spike model, suggests that the considerable kinetic energy of the projectile (in the MeVGeV range) is predominantly deposited in the form of a dense electronic excitation along the trajectory and can thus lead to localised melting of the material.…”
Section: Materials Response To Energetic Ionsmentioning
confidence: 99%
See 1 more Smart Citation
“…The passage of a swift heavy ion (SHI) through a solid material can result in permanent damage along the ion's trajectory and is commonly called an ion track [12,13,[23][24][25]. The most common description of the ion track formation, the thermal spike model, suggests that the considerable kinetic energy of the projectile (in the MeVGeV range) is predominantly deposited in the form of a dense electronic excitation along the trajectory and can thus lead to localised melting of the material.…”
Section: Materials Response To Energetic Ionsmentioning
confidence: 99%
“…swift heavy ions (SHI) was studied [5][6][7][8][9][10]. The reason for the present situation is that in comparison to insulators, semiconductors are less prone to this kind of radiation damage [11][12][13] and have thus not been extensively studied.…”
Section: Introductionmentioning
confidence: 99%
“…Such an evolution of the cross sections versus beam energy suggests a combined interaction of S e and S n . At high energy the i-TS model [23,24] describes quite well the cross section for Au beam energy larger than 22 MeV (Fig. 3a).…”
Section: Amourphous Siomentioning
confidence: 77%
“…This interaction is surely cooperative and possibly additive at ~10 MeV Au ion. Atomistic simulation allow have been used to describe defect formation from ballistic recoils and the i-TS model [23,24]. The binary collision approximation is used to create effective recoil spectra (energy and directions), and the inelastic thermal spike model is used to calculate the thermal energy distribution.…”
Section: Amourphous Siomentioning
confidence: 99%
“…The target beam dump lifetime is one year of operations (5500 h). For high energy ion beams, Electronic Energy Loss (S e ) was identified as the main damage process [2]. Even in metals such as pure titanium, high S e could induce defect [3] and track [4] formations.…”
Section: Introductionmentioning
confidence: 99%