Nanoinspection of Dielectric and Polarization Properties at Inner and Outer Interfaces in Functional Ferroelectric PZT Thin Films

Eng, Lukas M.

doi:10.1007/1-4020-3019-3_12

Cited by 1 publication

(1 citation statement)

References 41 publications

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“…As the potential profiles are through the interface, it may reflect energy level equalization, with charge exchange between the two materials. Sharp profiles have been reported for example in case of PZT/Pt/SiO2 interfaces [19]. The relative spreading of the potential can therefore be related to the spreading of the space charge associated to band bending, or to the specific geometry of the system.…”

Section: B Cross-sections Of Sc-ldpe-sc Sandwiches Using Different Af...mentioning

confidence: 95%

Nano-scale characterization of insulator-semicon contacts

Gullo¹,

Villeneuve-Faure²,

Roy³

et al. 2016

2016 IEEE International Conference on Dielectrics (ICD)

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A main challenge in the development of polymerinsulated HVDC power cables is to achieve a robust insulation, because the accumulation of space charge under electrical and/or thermal stresses can significantly reduce the cable reliability. The space charge formation depends on the electrode-insulation contact which refers to the transition of carbon-black filled host polymer ('semicon', SC) and unfilled polymer. The fundamental processes which govern the contact physics and their dependence on the microstructure properties of the polymer and the interface are still poorly understood. In this paper we present a methodology to probe SC-insulator contact properties on a nanometer scale and to investigate the impact of material processing.

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Section: B Cross-sections Of Sc-ldpe-sc Sandwiches Using Different Af...mentioning

confidence: 95%