2014
DOI: 10.1088/1757-899x/64/1/012025
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Nanocharacterization of titanium nitride thin films obtained by reactive magnetron sputtering

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Cited by 3 publications
(6 citation statements)
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“…The friction force of thin films can be determined using the lateral mode of AFM investigations according to the following formula [19]:…”
Section: Resultsmentioning
confidence: 99%
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“…The friction force of thin films can be determined using the lateral mode of AFM investigations according to the following formula [19]:…”
Section: Resultsmentioning
confidence: 99%
“…The influence of the substrate on the topography and the mechanical properties of aluminum, gold and silver thin films was studied in order to analyze if the substrate has an effect on the properties of the deposited films [6,11,13]. Atomic force microscopy (AFM) investigations were performed on an XE-70 AFM (from Park Systems) in a clean room.…”
Section: Methodsmentioning
confidence: 99%
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“…Another interesting solution is the use of diamond-like carbon (DLC). It is a metastable amorphous carbon material with significant sp 3 bonding; DLC shares some of the properties of diamond, such as high hardness, high elastic modulus, and chemical inertness, but it can be produced much more cheaply [20][21][22][23].…”
Section: Introductionmentioning
confidence: 99%
“…Merie et al [17] observed that increasing of the temper ature from room temperature to 250 °C decreases the roughness and increases the hardness of titanium nitride. Abadias et al [18] observed that increase of negative bias applied to the substrate increases the adatom mobility and compressive stress and degrades the (200) preferred orientation.…”
Section: Introductionmentioning
confidence: 99%