2004
DOI: 10.1016/j.chemgeo.2004.08.033
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Na-, Al-, and Si K-edge XANES study of sodium silicate and sodium aluminosilicate glasses: influence of the glass surface

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Cited by 25 publications
(18 citation statements)
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“…Edges occurring at lower energies are not able to provide a large enough energy range for EXAFS analysis due to interference from other elemental edges for most geochemically relevant materials. The edge itself has been extensively investigated both in minerals (cf., Li et al 1993Li et al , 1994Li et al , 1995aGilbert et al 2003) and glasses/melts (cf., Davoli et al 1992;Henderson 1995;Henderson and Fleet 1997;Henderson and St-Amour 2004;de Wispelaere et al 2004;de Ligny et al 2009). Furthermore, a significant amount of work has been published on this edge using electron energy loss (EELS), parallel electron energy loss (PEELS) or energy loss near edge spectroscopy (ELNES) and this literature can be very helpful for interpreting soft X-ray XANES spectra (cf., McComb et al 1991;Garvie et al 1994Garvie et al , 2000Sharp et al 1996;Poe et al 1997;van Aken et al 1998;Garvie and Buseck 1999).…”
Section: Silicon and Aluminum K-and L-edgesmentioning
confidence: 99%
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“…Edges occurring at lower energies are not able to provide a large enough energy range for EXAFS analysis due to interference from other elemental edges for most geochemically relevant materials. The edge itself has been extensively investigated both in minerals (cf., Li et al 1993Li et al , 1994Li et al , 1995aGilbert et al 2003) and glasses/melts (cf., Davoli et al 1992;Henderson 1995;Henderson and Fleet 1997;Henderson and St-Amour 2004;de Wispelaere et al 2004;de Ligny et al 2009). Furthermore, a significant amount of work has been published on this edge using electron energy loss (EELS), parallel electron energy loss (PEELS) or energy loss near edge spectroscopy (ELNES) and this literature can be very helpful for interpreting soft X-ray XANES spectra (cf., McComb et al 1991;Garvie et al 1994Garvie et al , 2000Sharp et al 1996;Poe et al 1997;van Aken et al 1998;Garvie and Buseck 1999).…”
Section: Silicon and Aluminum K-and L-edgesmentioning
confidence: 99%
“…Aluminum K-edge. The aluminum K-edge (~1550-1650 eV) has been extensively utilized in mineralogical and geochemical studies (McKeown et al 1985;McKeown 1989;Ildefonse et al 1994Ildefonse et al , 1995Ildefonse et al , 1998Li et al 1995b;Fröba et al 1995;Wu et al 1997a;Giuli et al 2000;Romano et al 2000;Arai and Sparks 2002;van Bokhoven et al 2003;Neuville et al 2004aNeuville et al , 2010de Wispelaere et al 2004;Khare et al 2005;Hu et al 2008;Xu et al 2010;Rivard et al 2013). In general the Al K-edge for 4-fold coordinated Al ( [4] Al) occurs at ~1566 eV and usually exhibits a single edge maximum or peak.…”
Section: Silicon and Aluminum K-and L-edgesmentioning
confidence: 99%
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“…The spectrum provides constraints for determining phases involved in geochemical reactions (e.g. Wong et al, 1994;Li et al, 1999;Wispelaere et al, 2004;Finch & Allison, 2008;Foster et al, 2008;Ingall et al, 2011). Recently, the application of Mg K-edge XANES to characterize the local environment of Mg in biogenic CaCO 3 produced by corals, bivalves and brachiopods has provided direct evidence for Mg incorporation into CaCO 3 (Finch & Allison, 2008;Foster et al, 2008;Cusack et al, 2008).…”
Section: Introductionmentioning
confidence: 99%
“…Na average bond valences below 0.2 v.u.) (Wispelaere et al, 2004). Na-O and Al-O bonds are longer than Si-O, but Si-O energy bond is at about 20% higher than energy of Al-O bond (Stein & Spera, 1993).…”
Section: Dietzel Theory Field Strength and Bonds In The Structurementioning
confidence: 99%