1972
DOI: 10.1002/crat.19720070420
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N. F. MOTT, E. A. DAVIS. Electronic Processes in Non‐Crystalline Materials Clarendon‐Press, Oxford 1971 437 Seiten. £ 7,50

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Cited by 41 publications
(16 citation statements)
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“…An important feature of the luminescence spectrum is that the position of the luminescence maximum is close to the center of the band gap (as determined by the position of optical absorption edge [8]). This is well illustrated by the model of Mott and Davis [9] stating that a band of localized states (several tenths of eV wide) is located in the center of the band gap of chalcogenide glass semiconductors. Optical transitions of electrons into this band can cause luminescence with the energy of light quanta close to the half-width of the band gap.…”
Section: Photoluminescence In Chalcogenide Glassesmentioning
confidence: 62%
“…An important feature of the luminescence spectrum is that the position of the luminescence maximum is close to the center of the band gap (as determined by the position of optical absorption edge [8]). This is well illustrated by the model of Mott and Davis [9] stating that a band of localized states (several tenths of eV wide) is located in the center of the band gap of chalcogenide glass semiconductors. Optical transitions of electrons into this band can cause luminescence with the energy of light quanta close to the half-width of the band gap.…”
Section: Photoluminescence In Chalcogenide Glassesmentioning
confidence: 62%
“…The conduction current I r can be theoretically estimated through the Hopping model (eq ). Among the bulk‐limited conduction mechanisms, this model mainly considers the hopping conduction as the dominant conduction mechanism in polar dielectric polymers: inormalr inormalhnormalonormalpnormalpnormalinormalnnormalg=i0normalexp|EnormalakTnormalsnormalinormalnh|qaE2kT where, E a is the conduction mechanism activation energy related to the average trap depth, k and T are the Boltzmann constant and the temperature, respectively, q is the charge carrier constant, a is the average trap distance, and E is the external applied electric field.…”
Section: Resultsmentioning
confidence: 99%
“…The blue slope of Fig. 7 described the conduction (or leakage) current that can be estimated based on the following Hopping model: 46,47…”
Section: Morphological Characterizationmentioning
confidence: 99%