Flexoelectricity is an increasingly popular subject because it can be extremely large in thin films and permits switching of devices in nonpolar (non-piezoelectric) crystals via application of inhomogeneous stresses. However, recent work has been limited to macroscopic measurement of voltage or strain. Here, we discuss the vibrational spectroscopy of flexoelectricity as a recommended new tool for thin-film characterization, with special emphasis upon incommensurate crystals.