Multiscale experimental characterization of solar cell defects

Škarvada, Pavel; Škvarenina, Ľubomír; Tománek, Pavel; Sobola, Dinara; Macků, Robert; Brüstlová, Jitka; Grmela, Lubomír; Smith, Steve

doi:10.1117/12.2259884

Cited by 5 publications

(5 citation statements)

References 12 publications

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“…This feature is indicative of at least two dominant processes with different time constants contributing to the noise . Noise observed at lower frequencies with high α values can be related to both the interface states and grain boundaries and noise at higher frequencies exhibiting α ≈ 1 is largely representative of trap‐limited bulk transport processes . Normalized noise (S(f))/I β in Figure (c) again indicates a unified behavior at low frequency.…”

Section: Resultsmentioning

confidence: 82%

Insights Into the Microscopic and Degradation Processes in Hybrid Perovskite Solar Cells Using Noise Spectroscopy

et al. 2017

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We report a clear correlation of the features observed in photocurrent noisefluctuations to the performance parameters of hybrid perovskite solar cells. The general trend of increasing noise amplitude which spreads over a wider range of frequency as a function of aging is established. High-resolution spatial mapping of the photocurrent in typical devices and the associated variation of the noise spectrum confirms the underlying trend.

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Section: Resultsmentioning

confidence: 82%

Insights Into the Microscopic and Degradation Processes in Hybrid Perovskite Solar Cells Using Noise Spectroscopy

et al. 2017

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“…One of the problems of such fields as photonics, nano‐magnetism, nanoelectronics is a problem of surface quality control. Reliable data of AFM contributes both preparation of new structures for electronics (Šik et al, ) and characterization of existing optoelectronic devises to improve their efficiency (Dallaeva, Tomanek, Skarvada, & Grmela, ; Skarvada et al, ).…”

Section: Introductionmentioning

confidence: 99%

Influence of scanning rate on quality of AFM image: Study of surface statistical metrics

Sobola

Ţălu

Solaymani

et al. 2017

Microscopy Res & Technique

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The purpose of this work is to study the dependence of AFM-data reliability on scanning rate. The three-dimensional (3D) surface topography of the samples with different micro-motifs is investigated. The analysis of surface metrics for estimation of artifacts from inappropriate scanning rate is presented. Fractal analysis was done by cube counting method and evaluation of statistical metrics was carrying out on the basis of AFM-data. Combination of quantitate parameters is also presented in graphs for every measurement. The results indicate that the sensitivity to scanning rate growths with fractal dimension of the sample. This approach allows describing the distortion of the images against scanning rate and could be applied for dependences on the other measurement parameters. The article explains the relevance and comparison of fractal and statistical surface parameters for characterization of data distortion caused by inappropriate choice of scanning rate.

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“…The example from leaving nature is presented in Figure 1. Sometimes preliminary investigation of surface is necessary to fulfill conditions of SPM measurements [24][25][26][27][28]. Observation of the surface by optical microscopy usually helps to estimate the area of interest for further SPM study.…”

Section: Organization Of the Study Processmentioning

confidence: 99%

Analysis and Recommendations for Education Process of Experts in the Field of Scanning Probe Microscopy

Ţălu¹,

Sobola²,

Papěž³

2017

dtssehs

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Abstract. This paper describes the mandatory conditions for training specialists in the widespread and still continuously developing microscopic technique for studying of materials surface. Traditional methods of education are not sufficient for teaching of the multidisciplinary subjects. Available information technologies and resources alone do not ensure learning success. There is need for a conceptual review and analysis of the cases in the sphere of specialists training. Scanning probe microscopy is based on the fundamental concepts of quantum mechanics, physics, chemistry, etc. In this regard, the specialist has to achieve knowledges in the field of science (physical and chemical laws), and at the same time there is necessity to be educated in approaches for the study and description of surface quality.

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Multiscale experimental characterization of solar cell defects

Cited by 5 publications

References 12 publications

Insights Into the Microscopic and Degradation Processes in Hybrid Perovskite Solar Cells Using Noise Spectroscopy

Insights Into the Microscopic and Degradation Processes in Hybrid Perovskite Solar Cells Using Noise Spectroscopy

Influence of scanning rate on quality of AFM image: Study of surface statistical metrics

Analysis and Recommendations for Education Process of Experts in the Field of Scanning Probe Microscopy

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