2013
DOI: 10.1016/j.tsf.2012.05.042
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Multireflection grazing incidence diffraction used for stress measurements in surface layers

Abstract: et al.. Multireflection grazing incidence diffraction used for stress measurementsin surface layers. Thin Solid Films, Elsevier, 2013, 530, pp.a b s t r a c t Keywords:Residual stress X-ray diffraction Synchrotron radiation Grazing incidence method The geometry based on the multireflection grazing incidence X-ray diffraction can be applied to measure residual stresses. Using this method, it is possible to perform a non-destructive analysis of the heterogeneous stresses for different and well defined volumes be… Show more

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Cited by 26 publications
(27 citation statements)
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“…The characteristic feature of this method is a small and constant incidence angle [10][11][12]. Consequently, the penetration depth of X-ray radiation is well defined and does not change during the experiment.…”
Section: Stress Measurements Using Grazing Incidence Geometrymentioning
confidence: 99%
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“…The characteristic feature of this method is a small and constant incidence angle [10][11][12]. Consequently, the penetration depth of X-ray radiation is well defined and does not change during the experiment.…”
Section: Stress Measurements Using Grazing Incidence Geometrymentioning
confidence: 99%
“…Therefore, the grazing incidence X-ray diffraction geometry (GIXD) was applied to measure residual stresses in thin surface layers [5][6][7][8][9][10][11][12]. In this work one of the version of the GIXD method referred to as the multi-reflection grazing incidence X-ray diffraction (MGIXD, [10][11][12]) was used in the laboratory diffractometer equipped with the Göbel mirror in the incident beam optics. Using this method, it is possible to perform a non-destructive stress analysis for different (and well defined) volumes below the surface of the sample and the stress can be measured at very shallow depths of a few micrometers.…”
Section: Introductionmentioning
confidence: 99%
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“…where: 2q {hkl} are the diffraction angles corresponding to those reflections hkl for which diffraction peaks are measured [8,10,11].…”
Section: Introductionmentioning
confidence: 99%
“…1). It is convenient to use for the MGIXD method, instead of < dðf; j; zÞ > fhklg , the so called equivalent lattice parameters < aðf; j; zÞ > fhklg and to express them with the macrostresses s I ij ðzÞ and strain free lattice constant a 0 [3,4,8,10,11]:…”
Section: Introductionmentioning
confidence: 99%