Stress measurements by multi-reflection grazing-incidence X-ray diffraction method (MGIXD) using different radiation wavelengths and different incident angles

Abstract

et al.. Stress measurements by multi-reflection grazing-incidence X-ray diffraction method (MGIXD) using different radiation wavelengths and different incident angles. Acta Materialia, Elsevier, 2017, 123, pp.157-166. <10.1016/j.actamat.2016.029>. <hal-01494293>Full length article Stress measurements by multi-reflection grazing-incidence X-ray diffraction method (MGIXD) using different radiation wavelengths and different incident angles t r a c tThe presented study introduces the development of the multi-reflection grazing-incidence X-ray diffraction method (MGIXD) for residual stress determination. The proposed new methodology is aimed at obtaining more reliable experimental data and increasing the depth of non-destructive stress determination below the sample surface. To verify proposed method measurements were performed on a classical X-ray diffractometer (Cu Ka radiation) and using synchrotron radiation (three different wavelengths: l ¼ 1.2527 Å, l ¼ 1.5419 Å and l ¼ 1.7512 Å). The Al2017 alloy subjected to three different surface treatments was investigated in this study. The obtained results showed that the proposed development of MGIXD method, in which not only different incident angles but also different wavelengths of X-ray are used, can be successfully applied for residual stress determination, especially when stress gradients are present in the sample.

On the Surface Residual Stress Measurement in Magnesium Alloys Using X-Ray Diffraction

“…The second approach uses different diffraction angles and has been used to measure the residual stress in thin films [ 36 ] and in coatings [ 33 ]. The third approach uses various incident angles, which provide different penetration depths in each measurement [ 32 , 37 , 38 ]. The relation of the incident angle and X-ray depth penetration provides an opportunity to obtain the stress profile within a few to several tens of micrometers without layer removal in Mg alloys.…”

High Transient-Thermal-Shock Resistant Nanochannel Tungsten Films

“…Lattice spacing changes caused by residual stress can be detected by the shift of Bragg angles (θ − θ 0 ), where θ 0 corresponds to the Bragg angle of the stress-free state. The grazing-incidence XRD (GIXRD) method (known as g − sin 2 ψ method) [30][31][32] is suitable for analysis of stress in thin films, since it employs an asymmetric diffraction geometry and controls the penetration depth of the X-ray by changing the angle α, which can effectively measure the diffraction peaks of thin films, as shown in Figure 1. The incident angle α is fixed, and diffraction peaks of different {hkl} planes are collected in a single 2θ scan.…”

A multireflection and multiwavelength residual stress determination method using energy dispersive diffraction

“…Hauk, 1997;Genzel, 1999;Ruppersberg et al, 1989;Klaus et al, 2009;. Alternatively, the measurements were performed for sample orientations for which the information depth was kept constant (Kumar et al, 2006;Erbacher et al, 2008;de Buyser et al, 1991;Van Acker et al, 1994;Quaeyhaegens et al, 1995;Marciszko et al, 2017). To characterize stress variation, different information depths were chosen by setting appropriate conditions for the experiment (usually the incident angle or energy of the X-rays).…”

“…The results obtained from MMXD will be compared with results from the multireflection grazing incidence X-ray diffraction method (MGIXD; see e.g. Marciszko et al, 2017), which uses only one wavelength (but multiple hkl reflections). A comparison will also be made with results of the ED (see e.g.…”

“…2(b). When different wavelengths of X-rays are used in the experiment, the information depth is defined by setting an appropriate angle for the given X-ray energy (see Marciszko et al, 2017).…”