Multilayer Diffraction Gratings Al/GaAs as Polaritonic Photodetectors

Abstract

This article is devoted to the investigation of multilayer diffraction grating of Al/GaAs using spectroscopic ellipsometry. The ellipsometric parameters y and D were measured under conditions of surface polariton excitation, as well. Various representations of the dielectric function for the analysis of optical data of Al films were examined. The representation using the Lorentzian oscillator approximation appears to be well-suited for this aim. The optical constants of thin Al films, obtained by the two methods, usual ellipsometry and polariton reflection spectroscopy, are compared. The measured optical constants were used to optimize the photodetector performance in the spectral range of interest.Stat#¾ posv¾ §ena issledovaniˇmnogoslojnyh diffrakcionnyh rexetok metodom spek-tral#noj +llipsometrii. *llipsometriqeskie parametry y i D takwe izmer¾lis# v us-lovi¾h vozbuwdeni¾ poverhnostnyh +lektromagnitnyh voln. Byli ispol#zovany ne-skol#ko sposobov opisani¾ di+lektriqeskoj funkcii dl¾ analiza optiqeskih svojstv Al plenok. Pokazano, qto metod Lorentcovskih oscill¾torov ¾vl¾ets¾ naibolee pod-hod¾ §im. Sopostavl¾ˇts¾ optiqeskie konstanty plenok Al, poluqennye dvum¾ metodami, obyqnoj ellipsometrii i pol¾ritonnoj spektroskopii otraweni¾. Izmerennye optiqeskie konstanty byli ispol#zovany dl¾ optimizacii parametrov fotodetektorov v issleduemoj oblasti spektra. 1 ) Fax: +38 044 265 8342;

Design and Characterization of Surface Barrier Heterostructures Based on Multilayer Diffraction Grating for Optoelectreonic Devices

“…Åêñïåðèìåíòàëüí³ ñïåêòðè òî÷êè åë³ïñîìåò-ðè÷íèõ êóò³â Ψ ³ Δ (ó âèïàäêó êîëè íàïðÿì âåêòîðà Å ïàðàëåëüíèé øòðèõàì ´ðàòêè, âèïàäîê s-ïîëÿðè-çàö³¿ ïàäàþ÷îãî ïðîìåíÿ [5]) òà ðîçðàõîâàí³ ñïåêòðè (ñóö³ëüí³ êðèâ³) äëÿ çðàçêà ITO/GaAs (ÄÃ).…”

On the nature of the Mn-related states in the band structure of (Ga,Mn)As alloys via probing the E1 and E1 + Δ1 optical transitions

“…18 From SE measurements, the spectral dependences of the ellipsometric angles WðkÞ and D(k) are obtained, which enable to calculate the effective complex dielectric function e 1 þ ie 2 . In order to obtain the ðe 1 ; e 2 Þ spectra of a near-surface layer of a sample one has to create a sample structure model of the investigated layered material, 19 containing such parameters as thicknesses, compositions, and pseudo dielectric functions of the substrate and the neighboring layers.…”

Modeling and Constituent Design of SPR Based and/or Waveguide Type Sensors

“…One-dimensional DG interfaces were received by using holographic etching [1,2]. Manufacturing layered structures were produced by thermal evaporation thin metal (Au, Ag, Al layers or Au/Ag bilayers and dielectric layers (SiO x )) as well as by d.c. magnetron sputtering (ITO) on the processed GaAs semiconductor substrates at RT.…”

“…Au, Ag, Al and bilayer Au/Ag were chosen as a plasmon-carrying metals because of their outlook for polaritonic optoelectronics device application due to the optical properties of theirs (when the important requirement for a SP excitation occurs). The basic properties of the main approaches to the determination of the optical constants of metal films are discussed in [1] for Au and in [2] for Al. Optical parameters for Ag were taken from [4].…”

“…Inclusion of additional covering and/or (intermediate) dielectric (SiO x ; x=2) and/or conducting (ITO) (tuning) layers in geometry with diffraction grating (DG) as input -coupling component to excite SPs is useful in modifying the SP resonant (SPR) characteristics and creating the potential for universal devices with multifunctional sensing capability (optochemical sensors [1], polarization -and wavelength (angle) -selective photodetectors etc. [2]). Properties (reflectance/ transmittance) of a multilayer stack with DG as optical waveguide (or a leaky quasi-waveguide) are described.…”