Multielement ultratrace analysis in tungsten using secondary ion mass spectrometry

Wilhartitz, P.; Virag, A.; Friedbacher, Gernot; Grasserbauer, M.; Ortner, H. M.

doi:10.1007/bf00469146

Cited by 19 publications

(6 citation statements)

References 10 publications

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“…dRatio of measured to calculated RSFs. should be constant over a large concentration range and the transfer from matrix A to matrix B should be simply possible by the use of ( 1) RSFB(el) = RSFA(el) RSFB(A) (3) where the subscript specifies the matrix and the analyte is in parentheses.…”

Section: Rsfmentioning

confidence: 99%

“…The availability of reference materials is limited and their preparation rather tedious. A method for the preparation of multielement reference materials by homogeneous doping of a metal-here W and Mo-with trace elements has been described elsewhere (3,4). The value of ion implantation for the preparation of reference materials for refractory metals is demonstrated in ref 5.…”

Section: Introductionmentioning

confidence: 99%

“…dimensions of the electrode. Arrays have many advantages over both microelectrodes and macroelectrodes including improved signal-to-noise ratio and lower limits of detection (1)(2)(3)(4)(5)(6)(7)(8)(9)(10)(11)(12)(13).…”

Section: Literature Cited Introductionmentioning

confidence: 99%

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Transferability of relative sensitivity factors in secondary ion mass spectrometry: an evaluation of the potential for semiquantitative ultratrace analysis of metals

Friedbacher¹,

Virag²,

Grasserbauer³

1990

Anal. Chem.

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Section: Rsfmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

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Transferability of relative sensitivity factors in secondary ion mass spectrometry: an evaluation of the potential for semiquantitative ultratrace analysis of metals

Friedbacher¹,

Virag²,

Grasserbauer³

1990

Anal. Chem.

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“…

A method for the separation and preconcentration of traces of phosphorus from tungsten was developed. Highly instrumented methods, such as high-resolution mass spectrometry techniques [2][3][4][5] or activation analysis [-6, 7] are applied for ultratrace analysis.

Phosphorus was determined by optical emission spectroscopy (OES) with inductively coupled plasma (ICP) excitation.…”

mentioning

confidence: 99%

“…Highly instrumented methods, such as high-resolution mass spectrometry techniques [2][3][4][5] or activation analysis [-6, 7] are applied for ultratrace analysis. To characterize these materials and to control the production process, trace and ultratrace analysis is required.…”

mentioning

confidence: 99%

Extraction inductively coupled plasma-optical emission spectrometry (ICP-OES) determination of traces of phosphorus in tungsten

et al. 1989

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A method for the separation and preconcentration of traces of phosphorus from tungsten was developed. Solid phase extraction of the phosphovanadomolybdate complex performed on a micro-column was applied. Phosphorus was determined by optical emission spectroscopy (OES) with inductively coupled plasma (ICP) excitation. A limit of detection of 0.4/~g/g P with respect to the solid phase is obtained. By directly coupling the extraction/elution step to the ICP instrument a detection limit of 0.06 #g/g P in W was achieved. Besides, the complexity of spectral evaluation in ICP-OES determinations of traces in spectralline-rich matrices is discussed.The determination of traces of phosphorus in highly purified tungsten and tungsten oxides is of major interest in certain fields of technology and production. It is assumed that even low concentrations of phosphorus unfavourably affect the quality of tungsten materials [1,2].An increasing demand exists for pure and ultrapure refractory metal products. To characterize these materials and to control the production process, trace and ultratrace analysis is required. Highly instrumented methods, such as high-resolution mass spectrometry techniques [2][3][4][5] or activation analysis [-6, 7] are applied for ultratrace analysis.

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Quantitative trace analysis of technical materials with solid state mass spectrometry: An analytical strategy for SIMS

Grasserbauer¹,

Stingeder²,

Friedbacher³

et al. 1989

Surface & Interface Analysis

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Based on an evaluation of important solid state mass spectrometric techniques regarding detection power, potential for quantitative analysis and applicability, an analytical strategy for the quantitative analysis of technical materials with high-performance SIMS that has the broadest applicability of all solid state mass spectrometry techniques is discussed. The major topics dealt with are reduction of random and systematic errors, preparation and characterization of suitable reference materials and assessment of precision and accuracy. It is intended to demonstrate that extensive procedures have to he applied to obtain accurate quantitative resultsaot only for SIMS but also for the other solid state mass spectrometric techniques.

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Multielement ultratrace analysis in tungsten using secondary ion mass spectrometry

Cited by 19 publications

References 10 publications

Transferability of relative sensitivity factors in secondary ion mass spectrometry: an evaluation of the potential for semiquantitative ultratrace analysis of metals

Transferability of relative sensitivity factors in secondary ion mass spectrometry: an evaluation of the potential for semiquantitative ultratrace analysis of metals

Extraction inductively coupled plasma-optical emission spectrometry (ICP-OES) determination of traces of phosphorus in tungsten

Quantitative trace analysis of technical materials with solid state mass spectrometry: An analytical strategy for SIMS

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