1990
DOI: 10.1021/ac00214a015
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Transferability of relative sensitivity factors in secondary ion mass spectrometry: an evaluation of the potential for semiquantitative ultratrace analysis of metals

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Cited by 7 publications
(4 citation statements)
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References 29 publications
(23 reference statements)
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“…Application of the matrix ion species ratio (MISR) method was required for the accurate depth profile determination of B in silicon due to severe sensitivity effects caused by the presence of 0 (16). The study of relative sensitivity factors (RSF) and their transferability between instruments and with the same instrument at different analysis times has been the subject of attention in several investigations (17,18). The use of ion implantation techniques to develop reliable SIMS standards and/or RSF compilations was also a popular subject in the review literature .…”
Section: Secondary Ion Mass Spectrometrymentioning
confidence: 99%
“…Application of the matrix ion species ratio (MISR) method was required for the accurate depth profile determination of B in silicon due to severe sensitivity effects caused by the presence of 0 (16). The study of relative sensitivity factors (RSF) and their transferability between instruments and with the same instrument at different analysis times has been the subject of attention in several investigations (17,18). The use of ion implantation techniques to develop reliable SIMS standards and/or RSF compilations was also a popular subject in the review literature .…”
Section: Secondary Ion Mass Spectrometrymentioning
confidence: 99%
“…The m ain question for sim s is whether this is possible at all. To stu d y this question r sf s for Li, K , N a, Ca and Mg in Mo, W, Nb, Ta, and W TilO were determ ined from m easurem ent o f im plant specim ens (Friedbacher 1990). It was found th a t the best m athem atical description o f the dependence o f the r sf on elem ental properties is obtained by p lottin g log r sf against E t (first ionization potential), if the r sfs are defined on num be concentrations.…”
Section: Optimization Of Measurement Techniquementioning
confidence: 99%
“…Quantification of labeled ASOs involves the use of a relative sensitivity factor (RSF) to correct measured ion ratios of interest and convert them into concentrations. To determine a reliable RSF, the development of robust external standards is of utmost importance. ,, The benefit of using the RSF is that it accounts for variables such as tuning or instrument response and can therefore be used on other NanoSIMS instruments . Once robust external standards are available for different labels, it also becomes possible to readily compare the concentration of different molecules within a cell, such as comparing a drug and its metabolites.…”
mentioning
confidence: 99%
“…8,25,26 The benefit of using the RSF is that it accounts for variables such as tuning or instrument response and can therefore be used on other NanoSIMS instruments. 27 Once robust external standards are available for different labels, it also becomes possible to readily compare the concentration of different molecules within a cell, such as comparing a drug and its metabolites.…”
mentioning
confidence: 99%