2005
DOI: 10.1007/s00216-005-3415-x
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Multielement trace determination in SiC powders: assessment of interlaboratory comparisons aimed at the validation and standardization of analytical procedures with direct solid sampling based on ETV ICP OES and DC arc OES

Abstract: The members of the committee NMP 264 "Chemical analysis of non-oxidic raw and basic materials" of the German Standards Institute (DIN) have organized two interlaboratory comparisons for multielement determination of trace elements in silicon carbide (SiC) powders via direct solid sampling methods. One of the interlaboratory comparisons was based on the application of inductively coupled plasma optical emission spectrometry with electrothermal vaporization (ETV ICP OES), and the other on the application of opti… Show more

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Cited by 22 publications
(17 citation statements)
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“…An IRIS advantage ICP OE spectrometer (Thermo Electron Corporation, Waltham, MA, USA) with graphite furnace model ETV-4000 was used. During atomisation, FREON R12 was added as a reaction gas to ensure complete deliberation of the analytes (Matschat et al, 2005). To calibrate the system, high purity graphite was first spiked with an aqueous standard solution.…”
Section: Element Detection Using Etv-icp Oesmentioning
confidence: 99%
“…An IRIS advantage ICP OE spectrometer (Thermo Electron Corporation, Waltham, MA, USA) with graphite furnace model ETV-4000 was used. During atomisation, FREON R12 was added as a reaction gas to ensure complete deliberation of the analytes (Matschat et al, 2005). To calibrate the system, high purity graphite was first spiked with an aqueous standard solution.…”
Section: Element Detection Using Etv-icp Oesmentioning
confidence: 99%
“…Matschat et al [12] beschreiben die Bewertung von Ringversuchen zur Validierung und Normung von direkten Feststoff-Analysenverfahren zur Multielement-Spurenbestimmung in in Siliciumcarbid-Pulvern mittels direkter Feststoffmethoden (ETV ICP OES und DC arc OES).…”
Section: Siliciumcarbidunclassified
“…For trace and ultra trace analysis chemicals used for fusion are often not clean enough and high salt contents are often not desirable for the analytical methods performed. Solid sampling methods such as instrumental photon activation analysis (IPAA), total reflection X‐ray fluorescence spectrometry (TXRF), ICP optical emission spectrometry (ICP OES) combined with slurry technique, DC arc optical emission spectrometry (DC‐arc‐OES), electrothermal vaporation ICP OES (ETV‐ICP OES), solid sampling electrothermal evaporation atomic absorption spectrometry (SS ET AAS) or carrier gas hot extraction (CGHE, for the elements hydrogen, nitrogen, oxygen) can be used for analysis of boron carbide and other advanced ceramics. These methods avoid any time‐consuming sample dissolution steps before the analysis, thus bearing fewer risks of contamination .…”
Section: Introductionmentioning
confidence: 99%