2021
DOI: 10.1016/j.matdes.2020.109188
|View full text |Cite
|
Sign up to set email alerts
|

Multi-method characterization approach to facilitate a strategy to design mechanical and electrical properties of sintered copper

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
3
1
1

Citation Types

0
7
0

Year Published

2022
2022
2025
2025

Publication Types

Select...
6
2
1

Relationship

1
8

Authors

Journals

citations
Cited by 17 publications
(7 citation statements)
references
References 40 publications
0
7
0
Order By: Relevance
“…In principle, single grains or grain boundaries are hardly detected through lab-scale µ-XCT. Nevertheless, a similar approach was reported by Wijaya et al [ 51 ], where the local crystal orientation of the microstructure was neglected and good correlation of experimental and numerical results of elastic properties was achieved. However, in case of solder joints, the local crystal anisotropy becomes a determining factor for solder joint reliability [ 52 ].…”
Section: Discussionmentioning
confidence: 78%
“…In principle, single grains or grain boundaries are hardly detected through lab-scale µ-XCT. Nevertheless, a similar approach was reported by Wijaya et al [ 51 ], where the local crystal orientation of the microstructure was neglected and good correlation of experimental and numerical results of elastic properties was achieved. However, in case of solder joints, the local crystal anisotropy becomes a determining factor for solder joint reliability [ 52 ].…”
Section: Discussionmentioning
confidence: 78%
“…The voxel size is 18.6 x 18.6 x 25 nm 3 . The curtaining and shadowing artefacts of the obtained tomography image data are reduced with FFT-lter 67 and histogram shifting methods 37,40 RMSE and R 2 are calculated by using mean_squared_error and r2_square modules. We set the number of features to be equal or more than two, so that different models with various number of features are generated and calculated.…”
Section: Methodsmentioning
confidence: 99%
“…In general, the material microstructure influences the material characteristics and a profound knowledge of the underlying structure-property relationships is crucial for an improved understanding as shown in e.g. 21 , 22 , 25 . The microstructure of the thin films cannot be neglected to understand the material behaviour 26 29 .…”
Section: Introductionmentioning
confidence: 99%