1978
DOI: 10.1109/t-ed.1978.19287
|View full text |Cite
|
Sign up to set email alerts
|

MP-A1 Electron-beam fabricated GaAs FET inverter

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2

Citation Types

0
3
0

Year Published

1980
1980
1987
1987

Publication Types

Select...
5
1

Relationship

0
6

Authors

Journals

citations
Cited by 27 publications
(3 citation statements)
references
References 1 publication
0
3
0
Order By: Relevance
“…At liquid nitrogen temperature the delay time was reduced to 17.5 ps with 9.2 mW power dissipation. A 34 ps gate delay has been reported using a depletion mode BFL [ 2 ] , and binary frequency dividers have been operated at around 5 GHz [3,4] Potential superiority of GaAs logic compared to Si is partially related to a higher electron velocity, especially in short submicron devices where the transient ("overshoot" [5-71 or "near-ballistic" [8-121) effects become important. indicate that an electron velocity in excess of 3 x lo5 m/s can be achieved in a submicron GaAs device.…”
Section: Erf Orrna Ce Prediction For Submicron Fl Logicmentioning
confidence: 99%
See 2 more Smart Citations
“…At liquid nitrogen temperature the delay time was reduced to 17.5 ps with 9.2 mW power dissipation. A 34 ps gate delay has been reported using a depletion mode BFL [ 2 ] , and binary frequency dividers have been operated at around 5 GHz [3,4] Potential superiority of GaAs logic compared to Si is partially related to a higher electron velocity, especially in short submicron devices where the transient ("overshoot" [5-71 or "near-ballistic" [8-121) effects become important. indicate that an electron velocity in excess of 3 x lo5 m/s can be achieved in a submicron GaAs device.…”
Section: Erf Orrna Ce Prediction For Submicron Fl Logicmentioning
confidence: 99%
“…where QI is a numerical constant (a N l), and Veff to L e f f by veff (io5 m/s) = (.22 -t 1.39 Leff)/Leff (2) where L e f f is in microns. (2) is obtained from the computer calculation of the transit time for typical drain-to-source voltages (1-3 v> for GaAs doped at 2 x 1017 cm-3 using the phenomenological transport equations…”
Section: Erf Orrna Ce Prediction For Submicron Fl Logicmentioning
confidence: 99%
See 1 more Smart Citation