2014
DOI: 10.1109/tmtt.2014.2303476
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MOST Moderate–Weak-Inversion Region as the Optimum Design Zone for CMOS 2.4-GHz CS-LNAs

Abstract: In this paper, the MOS transistor (MOST) moderate-weak inversion region is shown to be the optimum design zone for CMOS 2.4-GHz common-source low noise amplifiers (CS-LNA) focused on low power consumption applications. This statement is supported by a systematic study where the MOST is analyzed in all-inversion regions using an exhaustive CS-LNA noise figure-power consumption optimization technique with power gain constraint. Effects of bias choke resistance and MOST capacitances are carefully included in the … Show more

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Cited by 55 publications
(30 citation statements)
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“…The improvement in the g m /g ds due to FBB is clear, and it comes with no additional current consumption. It should be noted that in this analysis, the performance characterization of the device is studied in the MI region as this is the optimum region of operation for ULP and ULV designs [6], [23].…”
Section: B Mitigation Of Output Conductance Degradation Due To Shortmentioning
confidence: 99%
“…The improvement in the g m /g ds due to FBB is clear, and it comes with no additional current consumption. It should be noted that in this analysis, the performance characterization of the device is studied in the MI region as this is the optimum region of operation for ULP and ULV designs [6], [23].…”
Section: B Mitigation Of Output Conductance Degradation Due To Shortmentioning
confidence: 99%
“…One of the operation regions is when RF MOS transistors are biased at V th vicinity, attaining the highest g m /I D ratio [14]. Another is the triode region, easily reached for a medium/high resistive load value (R L ), which is the case for high-gain designs.…”
Section: N-type Metal-oxide-semiconductor Modelmentioning
confidence: 99%
“…The CS large-signal analytical study is feasible if a simple quasi-static I DS (V GS ) transfer characteristic, which fits the transistor behavior in the required operation regions, is found. One of the operation regions is when RF MOS transistors are biased at V th vicinity, attaining the highest g m /I D ratio [14]. Another is the triode region, easily reached for a medium/high resistive load value (R L ), which is the case for high-gain designs.…”
Section: N-type Metal-oxide-semiconductor Modelmentioning
confidence: 99%
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