2012
DOI: 10.1039/c2ra01129h
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Morphology of SiC nanowires grown on the surface of carbon fibers

Abstract: SiC nanowires (NWs) with diameters of 20-200 nm and lengths from tens to hundreds of micrometers have been synthesized by the carbothermal reduction of colloidal silica. The morphology and microstructure of NWs have been studied in detail by electron microscopy techniques. SiC NWs have been found to be hexagonal prisms, ''bamboo-like'' nanorods and nanobelts. The NWs with a [111] growth axis are hexagonal prism nanorods, while the nanobelts have growth directions varying from [110] to [113]. It has been found… Show more

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Cited by 33 publications
(19 citation statements)
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“…A broad diffraction peak ranging from 20° to 30° appears, representing residual carbon derived from coal mineral particles imply that the interior coal does not readily in the reaction. A small peak marked with “SF” ahead of the highest intensity peak (111) is presumably due to defects such as stacking faults and twin faults as is suggested in previous reports …”
Section: Resultssupporting
confidence: 60%
See 1 more Smart Citation
“…A broad diffraction peak ranging from 20° to 30° appears, representing residual carbon derived from coal mineral particles imply that the interior coal does not readily in the reaction. A small peak marked with “SF” ahead of the highest intensity peak (111) is presumably due to defects such as stacking faults and twin faults as is suggested in previous reports …”
Section: Resultssupporting
confidence: 60%
“…A small peak marked with "SF" ahead of the highest intensity peak (111) is presumably due to defects such as stacking faults and twin faults as is suggested in previous reports. 22,23 The phase compositions of samples were also examined by Raman spectroscopy. The spectra obtained from the samples annealed at different input microwave power rates exhibit similar shapes and peaks at ca.…”
mentioning
confidence: 99%
“…The regularly arranged lattice fringes are clearly observed, which reveals its high crystallinity. Simultaneously, the HRTEM image indicates that this crystalline structure contains heavy stacking faults and micro twins on the basal planes, similar to the reported results[25]. The atomic inter planar spacing is approximately 0.252 nm, which is equal to the8 spacing of the {111} crystal faces of 3C-SiC (JCPDS29-1129).…”
supporting
confidence: 73%
“…[39][40][41][42][43][44][45] The former generally involves catalyst while the latter one does not. [39][40][41][42][43][44][45] The former generally involves catalyst while the latter one does not.…”
Section: Grown Mechanism Of the Sicnwsmentioning
confidence: 99%