1988
DOI: 10.1116/1.575000
|View full text |Cite
|
Sign up to set email alerts
|

Morphology of metal phthalocyanine thin films

Abstract: Thin films of nickel phthalocyanine and copper phthalocyanine were deposited on substrates heated to 160 °C. These films were characterized by transmission electron microscopy, electron diffraction, and thickness and density measurements. The films were 1000–1500 Å thick and contained α phase crystallites with the stacking axis parallel to the substrate surface. Implications for electrical properties of the films are discussed.

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1
1
1
1

Citation Types

1
5
0

Year Published

1991
1991
2021
2021

Publication Types

Select...
8

Relationship

0
8

Authors

Journals

citations
Cited by 35 publications
(6 citation statements)
references
References 0 publications
1
5
0
Order By: Relevance
“…Indexing of the films was successfully performed assuming a monoclinic crystalline system 12 in which the three crystal axes are of unequal lengths, having one of their intersections oblique and the other two at right angles. 13 In the contrary, for the asevaporated and annealed films a single strong reflection peak is observed with experimental data being in better agreement with the tetragonal rather than the monoclinic crystal structure. From the full-width and half maximum of the first diffraction peak, for both as-deposited and annealed film, an estimate of the crystalline cluster approximately 32.5 nm was calculated using the Scherrer equation.…”
Section: A Structural Characterization Of Nipcsupporting
confidence: 59%
“…Indexing of the films was successfully performed assuming a monoclinic crystalline system 12 in which the three crystal axes are of unequal lengths, having one of their intersections oblique and the other two at right angles. 13 In the contrary, for the asevaporated and annealed films a single strong reflection peak is observed with experimental data being in better agreement with the tetragonal rather than the monoclinic crystal structure. From the full-width and half maximum of the first diffraction peak, for both as-deposited and annealed film, an estimate of the crystalline cluster approximately 32.5 nm was calculated using the Scherrer equation.…”
Section: A Structural Characterization Of Nipcsupporting
confidence: 59%
“…The most common polymorphic crystal phases occur in phthalocyanines are and , that have two crystallite structures. The phase is metastable and obtained either as a polycrystalline powder or as a thin film deposited on a cold substrate in vacuum 23,24 . The phase can be obtained in single crystal form or as a thin film formed by deposition of phthalocyanine on heated substrates 23 , which are thermodynamically stable 24 .…”
Section: Resultsmentioning
confidence: 99%
“…96,97,99 The polymorphic character of MPcs was rst reported by Hamm and Norman in 1948 for CuPc 102 and has since been extensively studied in a number of MPcs. 33,101,[103][104][105][106][107][108][109] MPcs are known to exists in various polymorphic forms identied as a, b, g, d, 3, and x-phases with the metastable a-phase and stable bphase being the most common and commercially signicant. 94,100,101 The phase transition from a to b occurs in most MPc thin-lms through exposure to temperature (200-300 C) 97,99,100,104 or organic solvents, 110,111 and is characterized by a change in tilt angle between planes and the degree of pelectron overlap (Fig.…”
Section: Packing Motifsmentioning
confidence: 99%