2019
DOI: 10.1016/j.dib.2019.104714
|View full text |Cite
|
Sign up to set email alerts
|

Morphological data on soft ferromagnetic Fe90Ta10 thin films

Abstract: Iron-tantalum (Fe–Ta) thin films were synthesized on silicon (Si) (100) substrates using a pulsed laser deposition (PLD) technique. For the analysis of all reported data, please refer to our main article “Magnetic and electrical properties of Fe90Ta10 thin films [1]”. Morphological data confirm the amorphous nature of the film. Mesokurtic surface of the film was revealed using atomic force microscopy (AFM) analysis. The compositions of target and films were determined using x-ray fluorescence (XRF) data. The c… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1

Citation Types

0
1
0

Year Published

2020
2020
2024
2024

Publication Types

Select...
5

Relationship

1
4

Authors

Journals

citations
Cited by 5 publications
(1 citation statement)
references
References 8 publications
(13 reference statements)
0
1
0
Order By: Relevance
“…Some other parameters specific to our PLD experiments include substrate temperatures of 400 °C, oxygen pressure in the range of 5–25 m Torr, and the laser energy density of 2 J/cm 2 . The details of our PLD setup are described elsewhere. ,, The crystallographic studies and phase purity of TiNO films were carried out using Bruker D8 advanced X-ray diffractometer. X-ray photoelectron spectroscopy (XPS) was performed using a Thermo Scientific (Waltham, MA, USA) model k alpha XPS instrument.…”
Section: Methodsmentioning
confidence: 99%
“…Some other parameters specific to our PLD experiments include substrate temperatures of 400 °C, oxygen pressure in the range of 5–25 m Torr, and the laser energy density of 2 J/cm 2 . The details of our PLD setup are described elsewhere. ,, The crystallographic studies and phase purity of TiNO films were carried out using Bruker D8 advanced X-ray diffractometer. X-ray photoelectron spectroscopy (XPS) was performed using a Thermo Scientific (Waltham, MA, USA) model k alpha XPS instrument.…”
Section: Methodsmentioning
confidence: 99%