MoO_x/Ag/MoO_xtransparent electrode by solution process

Abstract

We have investigated a dielectric–metal–dielectric (DMD) multilayer film, which is unique as compared with such conventional transparent conductive oxides as indium tin oxide (ITO). In this study, we have selected MoO3 and Ag as the dielectric material and metal, respectively, and employed a nano-mist method in addition to a vacuum evaporation one. The transmission spectra of the films indicated that the Ag morphology changed from isolated islands to continuous layers with increasing Ag layer thickness, and that the morphology change was enhanced by MoO3. Then, MoO3/Ag/MoO3 (MAM) multilayer-structured transparent electrodes could be fabricated by a nano-mist method as well as by a vacuum evaporation one. Comparative examination is made on the properties of MAM films fabricated by these two methods for their application.

Examination of photocatalytic Z-scheme system for overall water splitting with its electronic structure

“…Similar spectra were observed with thin Ag layers on MoO 3 substrates. 26 In contrast to Ag layers with average thicknesses of 10 and 30 nm, Ag layers with average thicknesses of 0.3 nm, 1.0 nm, and 3.0 nm exhibited sharp extinction bands attributable to the excitation of localized surface plasmon resonance (LSPR) in Ag particles, which are free from such materials as Ag 2 O and Ag 2 S on their surfaces. 32,49,50…”

“…With the further aid of the electron-microscopic images of thin Ag layers on MoO 3 substrates (Fig. 5) 26 and similarity of transmission spectra of thin Ag layers on MoO 3 substrates 26 to those of thin Ag layers on glass plates (Fig. 6), it was judged that Ag layers with ≧10 nm in average thickness were continuous, while Ag layers with 0.3 nm, 1.0 nm, and 3.0 nm average thickness were composed of isolated Ag islands.…”

“…It was difficult to take SEM images of thin Ag layers on the glass plates. 26 Thus, the surface morphology of the thin Ag layers was judged from the SEM images of thin Ag layers on the MoO 3 substrates, which were taken with a Hitachi Scanning Electron Microscope S-5000. The morphologies of the obtained samples were observed by a scanning microscope (JEOL JSM-7400F).…”

“…Similar spectra were observed with thin Ag layers on MoO 3 substrates. 26 In contrast to Ag layers with average thicknesses of 10 and 30 nm, Ag layers with average thicknesses of 0.3 nm, 1.0 nm, and 3.0 nm exhibited sharp extinction bands attributable to the excitation of localized surface plasmon resonance (LSPR) in Ag particles, which are free from such materials as Ag 2 O and Ag 2 S on their surfaces. 32,49,50 The electric resistance of thin Ag layers of 10 and 30 nm in average thickness was small (several tens of O sq À1 ), whereas that of the layers with 0.3, 1.0, and 3.0 nm average thickness was very large (410 kO sq À1 ).…”

Ultraflexible and High-Performance Multilayer Transparent Electrode Based on ZnO/Ag/CuSCN

“…Such harsh film-formation processes limited their applications. To solve this issue, solution-processed materials at low temperature, such as ZnO, NiO, MoO 3 , and poly­(3,4-ethylenedioxythiophene):poly­(styrene sulfonate) (PEDOT:PSS), have been studied, delivering promising results in the development of flexible solar cells and light-emitting diodes . Among them, PEDOT:PSS is the most widely used material in conventional organic optoelectronics.…”