2011
DOI: 10.1103/physrevb.83.085206
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Monte Carlo study of charge transport in organic sandwich-type single-carrier devices: Effects of Coulomb interactions

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Cited by 91 publications
(105 citation statements)
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References 38 publications
(58 reference statements)
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“…This was shown by Zhou et al for uncorrelated disorder 23 and by van der Holst et al for correlated disorder. 24 We note that these works show that at higher concentration, around 10%, these interactions cannot be neglected.…”
Section: Hopping Transport and The Random-resistor Networkmentioning
confidence: 99%
“…This was shown by Zhou et al for uncorrelated disorder 23 and by van der Holst et al for correlated disorder. 24 We note that these works show that at higher concentration, around 10%, these interactions cannot be neglected.…”
Section: Hopping Transport and The Random-resistor Networkmentioning
confidence: 99%
“…This is important when considering high charge density (i.e. approaching 1 charge per 100 sites) [128] and charge transport across a heterojunction [121] where short-range Coulomb interactions [129] have been shown to be important. Casalegno et al [127] describe a method which allows partial consideration of Coulomb interactions in ME, although this poses additional numerical challenges to implement self-consistently.…”
Section: 2mentioning
confidence: 99%
“…Extraction of charges from the semiconductor is a hopping process with the charge in energy set equal to the difference in energy between the site (including electrostatic interactions) and the Fermi level of the electrode. Injection, by contrast, is included by considering an array of charges stationed outside the device which can hop into the adjacent semiconductor [48,129,144]. In some cases the injection hops are restricted to the first layer of OSC sites within the device [48], consistent with nearest-neighbour hopping, or successive OSC layers into the device with an exponentially decreasing rate [144], consistent with variable-range hopping.…”
Section: Kinetic MC (Kmc)mentioning
confidence: 99%
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