2010
DOI: 10.1109/tns.2010.2044807
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Monte Carlo Simulation of Single Event Effects

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Cited by 189 publications
(77 citation statements)
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“…Deposition (MRED) code [45] confirm that the thin metal layers and passivation on these devices have minimal effects on the incident ion energy.…”
Section: Iii2 Pulse Capture Setupmentioning
confidence: 84%
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“…Deposition (MRED) code [45] confirm that the thin metal layers and passivation on these devices have minimal effects on the incident ion energy.…”
Section: Iii2 Pulse Capture Setupmentioning
confidence: 84%
“…Charge collection efficiency observed was on the order of 10%. This approximate charge collection efficiency was calculated using the integrated transient current signal from the scope, taking into account the charge deposited by the ion into the AlGaN and GaN layers, as calculated using MRED [45]. Charge collection enhancement is not observed in the broadbeam data (or for the microbeam data).…”
Section: Iv12 Resultsmentioning
confidence: 99%
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“…The contribution to the SER of nuclear reactions below the threshold LETs makes the problem more difficult, necessitating the use of the Monte Carlo simulation-based approach [23,27,28]. Monte Carlo methods have also been used for the description of deviations from the isolated SV approximation [29].…”
Section: Discussionmentioning
confidence: 99%
“…-For the WFI a 2.3 protons cm −2 s −1 flux has been assumed, which is roughly half the flux reported by CREME96 for the L2 orbit for the solar minimum (Marcus et al 2012;Tylka et al 1997;Weller et al 2010), which is the level we assumed in our work as a conservative value representative of the worst case. In addition, the WFI is better protected than X-IFU by a graded-Z shielding.…”
Section: Considerations On the Comparison With Other Instrumentsmentioning
confidence: 91%