Monte Carlo simulation of charge-trapped effects on dispersive electronic transient transport

Picos-Vega, A.; Zelaya-Ángel, O.; Ramı́rez-Bon, R.; Espinoza‐Beltrán, F.J.

doi:10.1103/physrevb.58.14845

Cited by 4 publications

(3 citation statements)

References 24 publications

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“…Then when t 2 ϳt 1 the variation of t m is proportional to the variation of t 2 , which is the result obtained by Picos-Vega et al 5 This means that effectively the temperature dependence of current is controlled through t 2 , the characteristic time for activation of a carrier in a trap. With these results Eq.…”

Section: Time-dependent Injection Ratesupporting

confidence: 67%

“…From these results three types of photocur-rent are relevant to show that effectively the peak shapes of photocurrents are due to the time delay of carriers at the interface contact sample 3,5 or in a reservoir layer. 5 Also, other authors 6 conclusions coincide with these results and they have proposed a use for the TOF technique using double-layer structures.…”

Section: Introductionsupporting

confidence: 65%

“…͑2͒, with the parameters t 1 and t 2 of the same order. The peak position for the time-dependent distribution (t) simulated by a random walk is proportional to the peak position of the simulated current, and it behaves as t m ϭe ϪE act /kT , 5 with E act as the energy necessary to activate a carrier from an unique kind of trap. For Eq.…”

Section: Time-dependent Injection Ratementioning

confidence: 99%

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Time-delayed charge-injection effects on photocurrent shape in a double layer

2000

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Transient photocurrents of double-layer structures were simulated by a random walk through a cubic lattice in this work. The canonical technique of time of flight was simulated to find the characteristics of the photocurrents shape when each layer had a different mobility. The results reproduce the main features of the experimental data from similar real experiments reported in the literature. Also, the origin of the peak shape of photocurrents is discussed and it is shown that it is related to a stochastic process which forces the out-ofequilibrium charge carriers to be injected from one layer to the other within a period of time (t,tϩdt) as given by a time-dependent probability (t)dt.

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Section: Time-dependent Injection Ratesupporting

confidence: 67%

Section: Introductionsupporting

confidence: 65%

Section: Time-dependent Injection Ratementioning

confidence: 99%

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Time-delayed charge-injection effects on photocurrent shape in a double layer

2000

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Simulation of transient transport in amorphous multilayers

Picos-Vega

Ramı́rez-Bon²

2002

Journal of Non-Crystalline Solids

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Interfacial trapping in an aged discotic liquid crystal semiconductor

Dawson

Patrick

Paul

et al. 2015

Journal of Applied Physics

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This study reports on time-of-flight (TOF) hole mobility measurements in aged 2,3,6,7,10,11-Hexakis(pentyloxy)triphenylene columnar liquid crystals. In contrast to the original samples reported in 2006, homeotropically aligned samples yielded TOF transients with an extended non-exponential rise. The experimental data were fit to a simple model that accurately reproduces the TOF transients assuming delayed charge release from traps near the optically excited electrode. While interfacial trapping appears only in the aged materials, the bulk mobility is similar to the pristine material. The model addresses dispersive transport in quasi-one-dimensional materials, determines the charge carrier mobility in systems with interfacial traps, and provides a method for characterizing the traps.

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Monte Carlo simulation of charge-trapped effects on dispersive electronic transient transport

Cited by 4 publications

References 24 publications

Time-delayed charge-injection effects on photocurrent shape in a double layer

Time-delayed charge-injection effects on photocurrent shape in a double layer

Simulation of transient transport in amorphous multilayers

Interfacial trapping in an aged discotic liquid crystal semiconductor

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