2013 Proceedings of the European Solid-State Device Research Conference (ESSDERC) 2013
DOI: 10.1109/essderc.2013.6818831
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Monolithic fabrication of a planar Gunn diode and a pHEMT side-by-side

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Cited by 4 publications
(7 citation statements)
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“…The spectrum analyser setup was used for the detection of the Gunn diode oscillations. Figure 12 illustrates the measured spectrum of the device presented above, one of the first oscillating devices implemented side-by-side with a pHEMT [10]. The power level generated by the diode was defined using a PM4 Erickson power meter, considering the loss introduced by the probe (-2.5 dB).…”
Section: B Results and Discussionmentioning
confidence: 99%
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“…The spectrum analyser setup was used for the detection of the Gunn diode oscillations. Figure 12 illustrates the measured spectrum of the device presented above, one of the first oscillating devices implemented side-by-side with a pHEMT [10]. The power level generated by the diode was defined using a PM4 Erickson power meter, considering the loss introduced by the probe (-2.5 dB).…”
Section: B Results and Discussionmentioning
confidence: 99%
“…Figure 6. SEM image of the fabricated 2x12 μm -wide device with 1.5 μm drain-to-source separation and the cross section of the 70 nm -long T-gate (inset) [10]. .…”
Section: A Fabrication Proceduresmentioning
confidence: 99%
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“…The first lithographic step incorporates the pattern definition of the Ohmic contacts following the same procedure as presented in [11]. A metal alloy consisting of 14-nm Au/14-nm Ge/14-nm Au/11-nm Ni/70-nm Au was evaporated for the simultaneous formation of the Ohmic contacts for both devices.…”
Section: Fabrication Of the Devicesmentioning
confidence: 99%
“…However, the current density of the multichannel devices was increased by approximately five times in comparison with the singlechannel devices, indicating that not all the channels contribute to the oscillation. The implementation of planar Gunn diodes and pHEMTs on GaAs substrates side-by-side has been recently studied [11], demonstrating the potential for amplification of the diode signal using a transistor-based amplifier on the same IC. However, the low-power level of −40-dBm suggested that we either improved the layer structure or moved to an InP-based system.…”
Section: Introductionmentioning
confidence: 99%