2009
DOI: 10.1016/j.jcrysgro.2008.09.109
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Monitoring of magnetization processes in GaMnAs ferromagnetic film by electrical transport measurement

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Cited by 2 publications
(1 citation statement)
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“…1(b) represents the temperature dependence of the resistance in our Hall device measured with a current density of 20 µA, which is small enough not to generate any detectable Joule heating during the measurement. The temperature scan of the resistance in a 1000 Oe field shows a typical behavior of a GaMnAs layer, which exhibits a maximum resistance near the ferromagnetic transition temperature 15 , 20 .…”
Section: Resultsmentioning
confidence: 97%
“…1(b) represents the temperature dependence of the resistance in our Hall device measured with a current density of 20 µA, which is small enough not to generate any detectable Joule heating during the measurement. The temperature scan of the resistance in a 1000 Oe field shows a typical behavior of a GaMnAs layer, which exhibits a maximum resistance near the ferromagnetic transition temperature 15 , 20 .…”
Section: Resultsmentioning
confidence: 97%