The electric field control of functional properties is a crucial goal in oxide-based electronics.Non-volatile switching between different resistivity or magnetic states in an oxide channel can be achieved through charge accumulation or depletion from an adjacent ferroelectric. However, the way in which charge distributes near the interface between the ferroelectric and the oxide remains poorly known, which limits our understanding of such switching effects.Here we use a first-of-a-kind combination of scanning transmission electron microscopy with electron energy loss spectroscopy, near-total-reflection hard X-ray photoemission spectroscopy, and ab-initio theory to address this issue. We achieve a direct, quantitative, atomic-scale characterization of the polarization-induced charge density changes at the interface between the ferroelectric BiFeO3 and the doped Mott insulator Ca1-xCexMnO3, thus providing insight on how interface-engineering can enhance these switching effects.
3The ferroelectric control of functional properties in strongly correlated oxide nanostructures through electrostatic carrier density modulations has inspired intensive research efforts 1,2 .The field effect technique is particularly attractive for nanostructures consisting of complex oxides such as mixed-valence manganites, as these electron-correlated systems exhibit rich phase diagrams 3 .Hole-doped mixed-valence manganites with predominant Mn 3+ oxidation state have been extensively investigated [3][4][5][6][7][8] . In particular, recent works have been devoted on the interface between the half-metal La1-xSrxMnO3 (LSMO) manganite and ferroelectrics such as Pb(ZrxTi1- In these recent reports 13,14 , the resistivity change in the manganite channel induced by polarization switching in the ferroelectric BiFeO3 was limited to one order of magnitude while changes of several orders were reported for thin films of CaMnO3 tuned by different doping levels, strains or by electrolyte gating 12 . Typical electron injection of around 0.1 free electrons in the manganite channel were estimated by Hall measurements and associated with this resistivity change.A charge distribution measurement on a unit cell scale at the Ca manganite/ferroelectric interface is thus required to understand, control and possibly enhance the magnitude of the resistivity switching effects. In the present study, a first-of-a-kind combination of scanning transmission electron microscopy (STEM) coupled to electron energy loss spectroscopy (EELS) [15][16][17][18] , and grazing-incidence hard x-ray photoemission spectroscopy (HAXPES) in a near-total-reflection (NTR) condition have been used as site-sensitive valence probes to address the electronic and structural properties of BiFeO3 and Ca1-xCexMnO3 heterostructures (x=0, 2, 4 at.% nominal Ce concentrations) at the atomic scale. Our experimental results have also been compared to local density functional theory (DFT).We have used these two novel and complementary methods to evaluate electron densities in manganite oxides. ...