2013
DOI: 10.1016/j.orgel.2013.04.017
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Molybdenum oxide anode buffer layers for solution processed, blue phosphorescent small molecule organic light emitting diodes

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Cited by 48 publications
(27 citation statements)
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“…By utilizing the s- 35 MoO x -treated AgNW TCE as the anode in ITO-free OLEDs, promising performance results of 29.2 lm/W and 10.3% E.Q.E. The solution-processed s-MoO x -treated AgNW TCEs exhibit a combination of several promising characteristics, such 30 as high and broad transmittance across a wavelength range of 400 to 1000 nm, total transmission of up to 95.9%, low R sheet of 29.8 ohm/sq, low haze value of 0.90%, better adhesion on the substrate, good flexibility, and preferable gap states for efficient hole injection in optoelectronic applications.…”
Section: Discussionmentioning
confidence: 99%
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“…By utilizing the s- 35 MoO x -treated AgNW TCE as the anode in ITO-free OLEDs, promising performance results of 29.2 lm/W and 10.3% E.Q.E. The solution-processed s-MoO x -treated AgNW TCEs exhibit a combination of several promising characteristics, such 30 as high and broad transmittance across a wavelength range of 400 to 1000 nm, total transmission of up to 95.9%, low R sheet of 29.8 ohm/sq, low haze value of 0.90%, better adhesion on the substrate, good flexibility, and preferable gap states for efficient hole injection in optoelectronic applications.…”
Section: Discussionmentioning
confidence: 99%
“…The s-MoO x -treated AgNW TCE was also subjected to an adhesion test using 3M Scotch tape. In contrast, the MoO x films prepared in the oxygen-deficient environment (e- 35 MoO x and s-MoO x annealed in N 2 ) contain atoms in Mo 6+ , Mo 5+ , and Mo 4+ oxidation states. The results show that the pristine AgNW TCE can be easily peeled off and thus has poor 15 mechanical adhesion to the substrate.…”
Section: Forward Scattered Light Haze Valuementioning
confidence: 99%
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“…[70][71][72][73] When they are in contact with ITO, there is a strong vacuum level shift resulting in the formation of an interface dipole at the ITO interface and reduction in hole injection barriers. 74 Similarly, Jian et al 75 MoO 3 .…”
Section: Methodsmentioning
confidence: 97%