2015
DOI: 10.1016/j.apsusc.2015.09.024
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Molecular dynamics simulation of VN thin films under indentation

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Cited by 62 publications
(18 citation statements)
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“…MOFs have nanoscale pore structure, so it is difficult to examine the adsorption property of refrigerant in MOFs through conventional experiment and theoretical method. With the rapid development of computer technology, molecular simulation technique has been extensively applied in scientific research [16][17][18][19][20][21][22][23] . Plenty of literature suggests that, molecular simulation has become the third research means apart from experiment and theory 12,[24][25][26][27][28][29] .…”
mentioning
confidence: 99%
“…MOFs have nanoscale pore structure, so it is difficult to examine the adsorption property of refrigerant in MOFs through conventional experiment and theoretical method. With the rapid development of computer technology, molecular simulation technique has been extensively applied in scientific research [16][17][18][19][20][21][22][23] . Plenty of literature suggests that, molecular simulation has become the third research means apart from experiment and theory 12,[24][25][26][27][28][29] .…”
mentioning
confidence: 99%
“…Next, the thin films interacted with an ideal spherical indenter with radius of 2 nm at a constant velocity of 50 m/s in -axis to obtain the load-depth (loading and unloading) curves. The parameter of radius and the impact velocity had been studied in another paper [6]. The load-depth is 1.6∼2.2 nm for each thin film.…”
Section: Nanoindentation Of Thin Filmsmentioning
confidence: 99%
“…However, the micromechanisms of NMLCs are difficult to reveal by these experiments. Therefore, analytical models [4] and numerical methods [5][6][7] were used to cover the shortage of experimental measurement.…”
Section: Introductionmentioning
confidence: 99%
“…EAM is effective for predicting material properties such as thermal expansion, melting temperatures, phase transformations, surface energies and vacancy formation energies, and simulation of structural behaviors such as grain boundaries and dislocations [17]. Besides the aforementioned MD simulations, MD is widely applied to low-dimensional systems such as nanowires [18][19][20][21], thin films [22,23] and nanoparticles [24][25][26], which indicates that EAM is capable to apply to lowdimensional systems. Therefore, EAM is employed in this study.…”
Section: Introductionmentioning
confidence: 99%