2011
DOI: 10.1016/j.jcrysgro.2011.09.023
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Molecular beam epitaxy grown GaNAsSb 1eV photovoltaic cell

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Cited by 37 publications
(26 citation statements)
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“…Moreover, the properties of these materials are very dependent on the growth conditions and post-growth thermal treatments [4][5][6][7]. Therefore, in order to obtain actual properties of the GaNAsSb alloy suitable for modeling purposes, several characterization techniques have been applied on GaNAsSb samples with doping levels in the range of 1•10 17 and 1•10 18 cm -3 for both n-type and p-type.…”
Section: Determination Of Ganassb Materials Parametersmentioning
confidence: 99%
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“…Moreover, the properties of these materials are very dependent on the growth conditions and post-growth thermal treatments [4][5][6][7]. Therefore, in order to obtain actual properties of the GaNAsSb alloy suitable for modeling purposes, several characterization techniques have been applied on GaNAsSb samples with doping levels in the range of 1•10 17 and 1•10 18 cm -3 for both n-type and p-type.…”
Section: Determination Of Ganassb Materials Parametersmentioning
confidence: 99%
“…Accordingly, in the following, we will use dilute nitride material diffusion lengths for the material (i.e. any Ga(In)NAs(Sb) material) similar to those already achieved experimentally [1,[4][5][6] (in the order of 10 times higher than the ones extracted from the EQE in Fig. 1.a) In order to usefully incorporate the Ga(In)NAs(Sb) into a 4Junction device, the demands on this material in terms of photocurrent are very high because this subcell receives the lowest spectral power density (the maximum photocurrent under ideal collection efficiency is 14.2 mA/cm 2 while for the other subcells it is about 16 mA/cm 2 ).…”
Section: Modeling the Performance Of 4-junction Solar Cellsmentioning
confidence: 99%
“…As such, these lower nitrogen content cells hold promise for improved performance (over 1-eV cells) due the reduced impact of nitrogen-related defects. In particular, dilute-nitride-antimonide alloys, such as GaAsSbN, could also be favorable over InGaAsN, since GaAsSbN materials grown by MBE have been reported to contain fewer nitrogen-related defects compared with InGaAsN materials [5]. In addition, Sb incorporation in dilute-nitride alloys gives rise to improve microstructure uniformity [6].…”
Section: Introductionmentioning
confidence: 99%
“…However these materials have demonstrated short minority carrier diffusion [4] and collection [3] and typically devices rely on wide depletion regions or intrinsic layers. GaNAsSb has been developed as an alternative dilute nitride material [5]. In this paper results are presented for devices in order to investigate the role minority carrier diffusion plays in their performance.…”
Section: Introductionmentioning
confidence: 99%