Modulation and crystallographic orientation of sputtered CoNi/Cr disks for longitudinal recording

Ohno, Toshiyuki; Shiroishi, Y.; Hishiyama, S.; Suzuki, Hirokazu; Matsuda, Yukio

doi:10.1109/tmag.1987.1065488

Cited by 39 publications

(7 citation statements)

References 12 publications

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“…More recently, Nolen and Fedkiw (2) reported increased selectivity for the reduction of nitrobenzene (NB) to p-aminophenol (PAP) using periodic-current control of a rotating disk electrode at nonkinetic-control conditions. Other examples of periodic voltage or current control of electroorganic reactions may be found in the literature [e.g., (3)(4)(5)(6)(7)(8)(9)]. …”

Section: Carnegie Mellon University Assisted In Meeting the Publicatimentioning

confidence: 99%

The Dependence of the Corrosion Behavior of Rigid Disk Magnetic Recording Media on the Deposition Conditions of the Underlayer, Magnetic Layer, and Carbon Overcoat

Sides

1992

J. Electrochem. Soc.

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The electrochemical response of thin-film rigid-disk samples of magnetic recording media prepared by dc magnetron sputtering and immersed in 3% (mass) KC1 aqueous solution was investigated. The disk samples had the general formulation C/CoNi/NiP/Cr/A1Mg; some were tested without the carbon overcoat. The argon pressure and sputtering power during sample preparation were varied between 0.66 and 2.0 Pa and between 1.6 and 4.8 W/cm ~, respectively. Electrochemical impedance analysis and linear sweep voltammetry yielded values for the double-layer capacitance and the faradaic resistance of each sample. The crucial finding was that the deposition conditions of the chromium underlayer determined the corrosion properties of the films; an argon pressure of 0.66 Pa and RF power of 4.8 W/cm ~ for the Cr deposition yielded corrosion-resistant films, but values of 2 Pa and 1.6 W/cm 2 yielded easily corroded films (deposition conditions of the other layers being held constant). The corrosion-resistant films were flat, relatively featureless, and the c-axis of the grains of CoNi alloy was in the plane of the thin film. The films susceptible to corrosion were rough with sharp edges and possible microgaps in the carbon layer, and the c-axis of the magnetic layer was perpendicular to the plane.

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Section: Carnegie Mellon University Assisted In Meeting the Publicatimentioning

confidence: 99%

The Dependence of the Corrosion Behavior of Rigid Disk Magnetic Recording Media on the Deposition Conditions of the Underlayer, Magnetic Layer, and Carbon Overcoat

Sides

1992

J. Electrochem. Soc.

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“…It is well known that Cr thin films deposited on either glass or NiP/AI substrates have either a {110 } or {002} crystallographic texture and that Co-based alloys deposited on such Cr underlayers usually have the {10] 1} or {1120} texture respectively. [4,5,6] However, the texture of Cr that develops when it is deposited onto {1011 } or {112.0}…”

Section: Conicr and Cocrta Thin Filmsmentioning

confidence: 99%

The role of microstructural phenomena in magnetic thin films. Progress report, [August 1990--December 1991]

Laughlin¹,

Lambeth²

1991

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This report was prepared as an account of work sponsored by an agency of the United States Govgrnment. Neither the United States Government nor any agency thereof, nor any of their employees, makes any warranty, express or implied, or assumes any legal liability°r responai" !}_. ,_. _ _ _ bility for the accuracy, completeness, or usefulness of any information, apparatus, product, or process disclosed, or represents that its use would not infringe privately owned rights. Refer-, .. ...... enee herein to any specific commercial product, process, or service by trade name, trademark, manutacturer, or otherwise does not necessarily constitute or imply [ts endorsement, recommendation, or favoring by the United States Government or any agency thereof, The views and opinions of authors expressed herein do not necessarily state or reflect those of the United State,s Government or any agency thereof.

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“…In addition, it has been reported [2,3] that the crystallographic orientation of a cobalt based alloy thin film, such as Co-CrTa, which is sputtered continuously onto a Cr underlayer, depends strongly on the orientation of the underlayer and that the in-plane component of magnetic anisotropy increases with the Cr underlayer deposition rate.…”

Section: Introductionmentioning

confidence: 99%

Influence of magnetic anisotropy distribution on interactions in Co-Cr-Ta thin films

et al. 1995

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Abstruct-In-plane remanence properties of Co-Cr-Ta thin films have been previously investigated in order to quantify magnetic interaction effects parallel to, and transverse to, the transfer direction. Samples were prepared at two deposition rates of the Cr underlayer. Magnetic layers deposited on high deposition rate Cr underlayer had lower peak heights of A Z and small coefficients of Id A Z/dHlmax. These properties were investigated for magnetic layer thicknesses between 20 and 100 nm. The magnetic interactions became stronger as the magnetic anisotropy increased with the decrease of the magnetic layer thickness. '

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Modulation and crystallographic orientation of sputtered CoNi/Cr disks for longitudinal recording

Cited by 39 publications

References 12 publications

The Dependence of the Corrosion Behavior of Rigid Disk Magnetic Recording Media on the Deposition Conditions of the Underlayer, Magnetic Layer, and Carbon Overcoat

The Dependence of the Corrosion Behavior of Rigid Disk Magnetic Recording Media on the Deposition Conditions of the Underlayer, Magnetic Layer, and Carbon Overcoat

The role of microstructural phenomena in magnetic thin films. Progress report, [August 1990--December 1991]

Influence of magnetic anisotropy distribution on interactions in Co-Cr-Ta thin films

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