Influence of magnetic anisotropy distribution on interactions in Co-Cr-Ta thin films

Abstract

Abstruct-In-plane remanence properties of Co-Cr-Ta thin films have been previously investigated in order to quantify magnetic interaction effects parallel to, and transverse to, the transfer direction. Samples were prepared at two deposition rates of the Cr underlayer. Magnetic layers deposited on high deposition rate Cr underlayer had lower peak heights of A Z and small coefficients of Id A Z/dHlmax. These properties were investigated for magnetic layer thicknesses between 20 and 100 nm. The magnetic interactions became stronger as the magnetic anisotropy increased with the decrease of the magnetic layer thickness. '

Interaction effects on the anisotropy field in sputtered Co-Cr-Ta thin films and metal particle tapes

“…Due to the induced anisotropy, our samples were selected as a series of four Co-Cr-Ta thin films on a Cr underlyer and produced by this technique. They have been extensively analysed and reported previously [8,9] and their main properties and the codification are given in table 2.…”