Interactions and reversal processes in CoCrTa/CoCrTaPt thin films

Morales, M.P.; O’Grady, K.; Zhang, B.; Bennett, W. R.; Rauch, G.C.

doi:10.1109/20.538700

Cited by 7 publications

(1 citation statement)

References 10 publications

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“…with common knowledge that films with smaller and more-uniform grain size usually exhibit smaller jitter, and therefore lower transition noise. The isolated grains are less exchange-coupled across grain boundaries compared with densely-spaced grains and this, in general, results in uniform transitions and low media noise [4]. On the other hand, high media noise exists if the film has large and non-uniform grains, non-isolated grain boundaries, such as the high-noise CoCrTaPt film, as well as the double-layer films in series C. The microstructural information explains well why the media noise of double-layer films in series C stays as high as that in the single-layer CoCrPtTa film and does not vary with the thickness ratio.…”

Section: Resultsmentioning

confidence: 99%

CoCrTa/CoCrPtTa double-layer films for magnetic recording

et al. 1996

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This paper reports the use of CoCrTa/CoCrPtTa using an MR head with gap length 0 32 pm The media noise was double-layer magnetic films to produce low-noise, high-integrated over the frequency range 1 2 to 36 2 MHz The track coercivity recording media. At an optimum thickness ratio, the average amplitude of the isolated pulses was used in the SMNR double layer films can reach higher coercivity (a,) than either of calculation the single-layer films of the above alloys. The signal-to-medianoise ratio of the composite can be a few dB higher than that of the single-layer CoCrPtTa film. Microstructure studies revealed TABLE I DOUBLE LAYER CONFIGURATIONS -~ that the bottom-layer film not only seeds the microstructure for the upper-layer film, but also determines the noise characteristics of the double-layer film. It is suggested that the strain and exchange coupling at the interface of the double-layer films are responsible for the enhancement of H,.

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Section: Resultsmentioning

confidence: 99%

CoCrTa/CoCrPtTa double-layer films for magnetic recording

et al. 1996

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Origins of substrate-topography-induced magnetic anisotropy in sputtered cobalt-alloy films

Twisselmann

Chambers

Ross

et al. 2002

Journal of Applied Physics

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Cr(001)/CoCrPt (112̄0) films, used in magnetic hard disks, exhibit in-plane magnetic anisotropy when grown over a substrate patterned with shallow grooves. In this experiment, Cr/CoCrPt films are grown over substrates that have been patterned using lithographic techniques to produce well-controlled topography. The in-plane anisotropy, which is of the order of 104 J m−3, increases with the groove height and frequency. This magnetic anisotropy is a result of anisotropic in-plane crystallographic orientation and anisotropic stress. Stress-induced anisotropy accounts for up to 25% of the total in-plane anisotropy, but the major contribution to the anisotropy is a preferential Co c-axis alignment parallel to the groove direction.

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In-plane magnetic anisotropy in CoCrPt and CoCrTa films deposited onto patterned silicon substrates

Twisselmann

Farhoud

Smith

et al. 1999

Journal of Applied Physics

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Topographically induced in-plane magnetic anisotropy has been observed in CoCrTa and CoCrPt films deposited onto oxidized silicon substrates which are lithographically patterned with fine grooves of period 200–320 nm and amplitude 20–50 nm. The coercivity and remanence are higher parallel to the grooves. Anisotropy has been observed in both rf- and dc-magnetron sputtered films with a (112̄0) preferred orientation, which is achieved by growth at elevated temperature on a (200)-oriented Cr underlayer at low base pressures. Anisotropy increases with the amplitude of the grooves in the silica substrate.

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Interactions and reversal processes in CoCrTa/CoCrTaPt thin films

Cited by 7 publications

References 10 publications

CoCrTa/CoCrPtTa double-layer films for magnetic recording

CoCrTa/CoCrPtTa double-layer films for magnetic recording

Origins of substrate-topography-induced magnetic anisotropy in sputtered cobalt-alloy films

In-plane magnetic anisotropy in CoCrPt and CoCrTa films deposited onto patterned silicon substrates

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