Modification of the crystal structure of gadolinium gallium garnet by helium ion irradiation

Ostafiychuk, B. K.; Yaremiy, I. P.; Yaremiy, S. I.; Fedoriv, Vasyl; Tomyn, U. O.; Umantsiv, M. M.; Фодчук, І. М.; Kladko, V. P.

doi:10.1134/s1063774513070122

Cited by 8 publications

(4 citation statements)

References 3 publications

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“…Of course, when crystal distortions due to defects are sufficiently strong to cause observable diffuse scattering intensities, the measurement of reciprocal space maps by using the high‐resolution triple‐crystal X‐ray diffractometer is of exceptional importance for the assessment of more details on defect structures in ion‐implanted layers . However, in general, to understand the mechanisms of growth defects appearance and damage formation in materials irradiated with energetic ions the various additional analytical techniques are necessary, such as transmission electron microscopy, ion and electron Rutherford backscattering spectrometry, Raman spectroscopy, X‐ray photoelectron spectroscopy, small‐angle X‐ray scattering, positron annihilation spectroscopy etc.…”

Section: Discussionmentioning

confidence: 99%

Dynamical X‐ray diffraction theory: Characterization of defects and strains in as‐grown and ion‐implanted garnet structures

Olikhovskii

Molodkin

Skakunova

et al. 2017

Physica Status Solidi (b)

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The generalized dynamical theory of X-ray diffraction by imperfect single crystals is extended to characterize structure imperfections of real single crystals with complex basis and similar crystalline films with inhomogeneous strain fields. The influence of various defects (intrinsic and extrinsic point defects, nanoclusters, and microdefects), simultaneously presented in such structures, on changing both average and fluctuating strain fields as well as structure factors are taken into account. The analytical expressions connecting immediately the coherent and diffuse components of the scattering intensity with statistical characteristics of these defects are obtained. Thus, the self-consistent description of the coherent and diffuse dynamical diffraction intensity components is provided. Some examples of the application of the developed theoretical model to treat rocking curves measured from various garnet structures by using high-resolution double-crystal X-ray diffractometer are reviewed. Possibilities for the quantitative characterization of structural defects and strain profiles in the as-grown and ion-implanted garnet single crystals and yttrium iron garnet films are demonstrated.The self-consistent dynamical description of coherent and diffuse scattering intensities from imperfect crystal structures with inhomogeneous strain fields and randomly distributed defects make it possible to determine the parameters of strain profiles and statistical characteristics of defects by analytical treating the coherent and diffuse components of rocking curves measured by the high-resolution double-crystal X-ray diffractometer with widely open detector window.

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Section: Discussionmentioning

confidence: 99%

Dynamical X‐ray diffraction theory: Characterization of defects and strains in as‐grown and ion‐implanted garnet structures

Olikhovskii

Molodkin

Skakunova

et al. 2017

Physica Status Solidi (b)

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“…The distribution of defects in the ion-implanted layer is given in the form of stairs that describe two types of parameters: the concentration of defects and their radii. Minimization of the function of MSD was carried out by changing the concentration and radii of defects according to the second approach [20].…”

Section: Algorithm For Determining the Parameters Of The Structurementioning

confidence: 99%

X-ray diagnostics of the structure of nearsurface layers of ionimplanted monocrystalline materials

Yaremiy

Повх

et al. 2018

EEJET

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Розроблено методику отримання iнформацiї про розподiл параметрiв кристалiчної структури по товщинi приповерхневого iонно-iмплантованого шару, типи та характеристики радiацiйних дефектiв (розмiр, концентрацiю та iн.). Встановлено вплив основних дифракцiйних параметрiв на кривi дифракцiйного вiдбивання, що дало можливiсть розробити алгоритм наближення експериментальних кривих дифракцiйного вiдбивання теоретично обчисленими. Показано, що при невеликих дозах iмплантацiї на iнтенсивнiсть кривих дифракцiйного вiдбивання величина коефiцiєнта екстинкцiї µ ds найбiльше впливає за межами додаткової осциляцiйної структури, а величина статичного фактора Дебая-Валлера Eв межах останнiх осциляцiй додаткової осциляцiйної структури, якi вiдповiдають максимальнiй деформацiї. При цьому для характеристики дефектної системи необхiдно аналiзувати дифузну складову, використовуючи частину кривої дифракцiйного вiдбивання, яка розмiщена за додатковою осциляцiйною структурою i в якiй вклад когерентної складової є мiнiмальним. Методику апробовано при аналiзi iмплантованих iонами бору плiвок залiзо-iтрiєвого гранату. Представлений пiдхiд дає можливiсть отримати велику кiлькiсть iнформацiї про структуру iонно-iмплантованого шару, оскiльки використовує статистичну динамiчну теорiю розсiяння рентгенiвських променiв, яка враховує наявнiсть дефектiв кристалiчної структури будь-яких типiв та розмiрiв. Також даний пiдхiд дає можливiсть використовувати всю iнформацiю, яку несуть в собi кривi дифракцiйного вiдбивання, та оцiнити ступiнь однозначностi визначених параметрiвКлючовi слова: профiль деформацiї, дифракцiя рентгенiвських променiв, iонна iмплантацiя, дефекти структури, статистична динамiчна теорiя розсiяння рентгенiвських променiв UDC 538.911+519.688

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“…Analysis of deformations that occur in the surface layers of the materials held by us in [6,7], but taking into account the orientation of defects at X-ray analysis it was not implemented. In order to obtain the approximating functional dependence of the extinction coefficient on radius R and concentration c of dislocation loops and on the angular deviation of the incident beam from the exact Bragg position (∆ ), analytical expressions obtained in [8] were used.…”

Section: Calculation Of сOefficients In Approximation Formulasmentioning

confidence: 99%

Numerical Calculation of Extinction Coefficient for Dislocation Loops with a Certain Orientation

Yaremiy

Tomyn

Yaremiy

et al. 2016

jpnu

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Abstract. Approximation formulas for the calculation of extinction coefficients in a wide range of radii and concentrations of dislocation loops oriented in certain directions were obtained. It was shown that received expressions make it possible to quickly calculate with satisfactory accuracy the angular dependence of extinction coefficient and speed up the calculation of theoretical rocking curves.

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Modification of the crystal structure of gadolinium gallium garnet by helium ion irradiation

Cited by 8 publications

References 3 publications

Dynamical X‐ray diffraction theory: Characterization of defects and strains in as‐grown and ion‐implanted garnet structures

Dynamical X‐ray diffraction theory: Characterization of defects and strains in as‐grown and ion‐implanted garnet structures

X-ray diagnostics of the structure of nearsurface layers of ionimplanted monocrystalline materials

Numerical Calculation of Extinction Coefficient for Dislocation Loops with a Certain Orientation

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Modification of the crystal structure of gadolinium gallium garnet by helium ion irradiation

Cited by 8 publications

References 3 publications

Dynamical X‐ray diffraction theory: Characterization of defects and strains in as‐grown and ion‐implanted garnet structures

Dynamical X‐ray diffraction theory: Characterization of defects and strains in as‐grown and ion‐implanted garnet structures

X-­ray diagnostics of the structure of near­surface layers of ion­implanted monocrystalline materials

Numerical Calculation of Extinction Coefficient for Dislocation Loops with a Certain Orientation

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X-ray diagnostics of the structure of nearsurface layers of ionimplanted monocrystalline materials