Moderne Röntgenbeugung

Abstract

Das Werk einschlieBlich aller seinerTeile ist urheberrechtlich geschOtzt. Jede Verwertung auBerhalb der engen Grenzen des Urheberrechtsgesetzes ist ohne Zustimmung des Verlags unzulassig und strafbar. Das gilt insbesondere fOr Vervielfaltigungen, Obersetzungen, Mikroverfilmungen und die Einspeicherung und Verarbeitung in elektronischen Systemen.Die Wiedergabe von Gebrauchsnamen, Handelsnamen, Warenbezeichnungen usw. in diesem Werk berechtigt auch ohne besondere Kennzeichnung nicht zu der Annahme, dass solche Namen im Sinne der Warenzeichen-und Markenschutz-Gesetzgebung als frei zu betrachten waren und daher von jedermann benutzt werden dOrften.Umschlaggestaltung: Ulrike Weigel, www.CorporateDesignGroup.de Gedruckt auf saurefreiem und chlorfrei gebleichtem Papier.

Evolution of residual stress in Ti–Al–Ta–N coatings on hard metal milling inserts

“…1) given e.g. in [15] from the regression in a diagram strain vs. sin 2 ψ in which only the stress component parallel to the cutting edge was considered.…”

“…The diffraction angles of the measured diffraction maxima were then determined by TOPAS 4.2 software (Bruker AXS, Germany) [14]. For each sample the residual stress component parallel to the surface and parallel to the straight portion of the cutting edge was then deduced from the slope determined by linear regression in the sin 2 ψ-plot according to the formalism described in [15].…”

Coating Applications for Cutting Tools

“…As discussed by Spieß et al, one has to be careful because the texture coefficient is only a rough estimation of preferred orientation. For thin films, the pole figures are more adequate to describe the crystal orientation (Birkholz, 2006;Spieß, Schwarzer, Behnken, & Teichert, 2005). One example is the 006 texture, which has a very low standard intensity of 2% and shows high textures with low peak intensities.…”

The materials science synchrotron beamline EDDI for energy-dispersive diffraction analysis

“…The theory of X-ray stress analysis (XSA) has been described in detail in a number of textbooks (see, for example Refs. [17][18][19]) and so only a very brief summary regarding some important aspects of a depth-resolved analysis of the strain/stress fields below the surface will be given here. In ED-XSA it is important to note that each reflexion EðhklÞ on the energy scale has to be assigned to another (average) information depth t. A general formulation of the 1=e penetration depth t being defined as the depth below the surface where 63% of the total diffracted intensity comes from, is given by [20] t ¼ sin 2 y À sin 2 c þ cos 2 y sin 2 c sin 2 Z 2mðEÞ sin y cos c where s 1 ðhklÞ and 1 2 s 2 ðhklÞ are the diffraction elastic constants (DEC).…”