The materials science synchrotron beamline EDDI for energy-dispersive diffraction analysis

Genzel, Ch.; Denks, Ingwer A.; Gibmeier, Jens; Klaus, Manuela; Wagener, Guido

doi:10.1016/j.nima.2007.05.209

Cited by 202 publications

(151 citation statements)

References 20 publications

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“…In-situ annealing experiment setup: For the real-time EDXRD analysis, nanorod films were annealed in a sealed reaction box inside a vacuum chamber coupled to the polychromatic synchrotron beamline EDDI at BESSY II [50].…”

Section: Electrophoretic Depositionmentioning

confidence: 99%

Phase-transition-driven growth of compound semiconductor crystals from ordered metastable nanorods

et al. 2014

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Section: Electrophoretic Depositionmentioning

confidence: 99%

Phase-transition-driven growth of compound semiconductor crystals from ordered metastable nanorods

et al. 2014

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“…Both TiN samples were characterized also at the Energy Dispersive Diffraction (EDDI) beamline of HelmholtzZentrum Berlin (BESSY), Germany (Genzel et al, 2007). The diffraction experiments were carried out using a white X-ray beam in the energy range 20À100 keV with beam dimensions of 500 Â 500 mm in reflection geometry (Fig.…”

Section: Synchrotron Energy Dispersive Xrdmentioning

confidence: 99%

X-ray analysis of residual stress gradients in TiN coatings by a Laplace space approach and cross-sectional nanodiffraction: a critical comparison

et al. 2013

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Novel scanning synchrotron cross-sectional nanobeam and conventional laboratory as well as synchrotron Laplace X-ray diffraction methods are used to characterize residual stresses in exemplary 11.5 mm-thick TiN coatings. Both real and Laplace space approaches reveal a homogeneous tensile stress state and a very pronounced compressive stress gradient in as-deposited and blasted coatings, respectively. The unique capabilities of the cross-sectional approach operating with a beam size of 100 nm in diameter allow the analysis of stress variation with sub-micrometre resolution at arbitrary depths and the correlation of the stress evolution with the local coating microstructure. Finally, advantages and disadvantages of both approaches are extensively discussed.

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“…Unlike the angle-dispersive diffraction mode, the energy-dispersive diffraction is carried out at a fixed diffraction angle and generates a multitude of diffraction lines during one measurement at fixed diffraction angle [21]. For the present study, the diffraction angle was set to 2 = 6°.…”

Section: Experimental Setup Of Diffraction Measurementsmentioning

confidence: 99%

Complementary Methods for the Characterization of Corrosion Products on a Plant-Exposed Superheater Tube

Okoro

Nießen

Villa

et al. 2016

Metallogr. Microstruct. Anal.

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The materials science synchrotron beamline EDDI for energy-dispersive diffraction analysis

Cited by 202 publications

References 20 publications

Phase-transition-driven growth of compound semiconductor crystals from ordered metastable nanorods

Phase-transition-driven growth of compound semiconductor crystals from ordered metastable nanorods

X-ray analysis of residual stress gradients in TiN coatings by a Laplace space approach and cross-sectional nanodiffraction: a critical comparison

Complementary Methods for the Characterization of Corrosion Products on a Plant-Exposed Superheater Tube

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