2002
DOI: 10.1080/08927020290030224
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Modelling oxide thin films

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Cited by 25 publications
(32 citation statements)
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“…These restrictions explain the limited number of papers investigating the deposition not only of TiO 2 and ZnO films but also of other oxide films by MD simulations [48][49][50]. In the work of Sayle et al [48] the authors employed three MD simulation methodologies to investigate the nucleation, growth and structure of oxides deposited on oxide substrates, showing that the substrate influences critically the structure of the deposited film, as well as the interfacial ion densities and various epitaxial relationships. Hasnaoui et al [49] investigated the oxidation of aluminium single crystal using MD with dynamic charge transfer between atoms.…”
Section: Introductionmentioning
confidence: 98%
“…These restrictions explain the limited number of papers investigating the deposition not only of TiO 2 and ZnO films but also of other oxide films by MD simulations [48][49][50]. In the work of Sayle et al [48] the authors employed three MD simulation methodologies to investigate the nucleation, growth and structure of oxides deposited on oxide substrates, showing that the substrate influences critically the structure of the deposited film, as well as the interfacial ion densities and various epitaxial relationships. Hasnaoui et al [49] investigated the oxidation of aluminium single crystal using MD with dynamic charge transfer between atoms.…”
Section: Introductionmentioning
confidence: 98%
“…This allows to study larger system sizes (18 nm square surface areas [43] or tens of thousands of atoms [44])…”
Section: Interatomic Potentials and First Principles Studies Of Bulk mentioning
confidence: 99%
“…In the present paper (semi-infinite media), the function gðxÞ does not vary with the interfacial material system size (as it would be the case for thin films, for example) since we are not accounting for interfaces interactions. The structural mismatch at the interface is usually defined as (Romanov et al, 1998, Sayle et al, 2002 …”
Section: Interfacial Kinematicsmentioning
confidence: 99%