“…So, characterization techniques are proposed in (Weng, H., et al, 2011) (Baudry, D., et al, 2007) (Fan, H. & Schlagenhaufer, F., 2007a) (Weng, H., et al, 2005) (De Daran, F., et al, 2003) (Labussiere-Dorgan, C., et al, 2008 (Taaghol, A. & Sarkar, T. K., 1996) (Fan, H. & Schlagenhaufer, F., 2007b) (Alvarez López, Y., et al, 2009) for the prediction of the undesired near-field (NF) produced by the analog, digital and mixed circuits.…”