2008
DOI: 10.1109/temc.2007.911918
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Modeling the Electromagnetic Emission of a Microcontroller Using a Single Model

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Cited by 72 publications
(42 citation statements)
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“…So, characterization techniques are proposed in (Weng, H., et al, 2011) (Baudry, D., et al, 2007) (Fan, H. & Schlagenhaufer, F., 2007a) (Weng, H., et al, 2005) (De Daran, F., et al, 2003) (Labussiere-Dorgan, C., et al, 2008 (Taaghol, A. & Sarkar, T. K., 1996) (Fan, H. & Schlagenhaufer, F., 2007b) (Alvarez López, Y., et al, 2009) for the prediction of the undesired near-field (NF) produced by the analog, digital and mixed circuits.…”
Section: Introductionmentioning
confidence: 99%
“…So, characterization techniques are proposed in (Weng, H., et al, 2011) (Baudry, D., et al, 2007) (Fan, H. & Schlagenhaufer, F., 2007a) (Weng, H., et al, 2005) (De Daran, F., et al, 2003) (Labussiere-Dorgan, C., et al, 2008 (Taaghol, A. & Sarkar, T. K., 1996) (Fan, H. & Schlagenhaufer, F., 2007b) (Alvarez López, Y., et al, 2009) for the prediction of the undesired near-field (NF) produced by the analog, digital and mixed circuits.…”
Section: Introductionmentioning
confidence: 99%
“…Some of the developed models require the knowledge of internal functions of the device under test (DUT) [1][2]. Others have been built up using only the EM radiated field as input data.…”
Section: Introductionmentioning
confidence: 99%
“…Parametric modeling of I/O ports from measured transient responses has been addressed in [1] and the modeling of power supply ports is addressed in [2,3,4]. In this paper, we demonstrate those methods by developing models for both I/O and power supply ports for an high-speed IC memory, that is a 512Mb NOR Flash memory in 90nm technology produced by Numonyx.…”
Section: Introductionmentioning
confidence: 99%