2012 IEEE 38th Photovoltaic Specialists Conference (PVSC) PART 2 2012
DOI: 10.1109/pvsc-vol2.2012.6656765
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Modeling the effects of Na incorporation on CIGS solar cells

Abstract: In this paper, we quantitatively evaluate the relative importance of three mechanisms that are proffered by various groups to interpret the effects of sodium (Na) incorporation in copper indium gallium diselenide solar cells. The suggested mechanisms are 1) increase in the carrier density due to defect passivation; 2) spatial redistribution of gallium (Ga); and 3) change in the crystal orientation. The simulation framework which is developed for this purpose indicates that, among these three coexisting effects… Show more

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Cited by 2 publications
(7 citation statements)
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“…Na diffusion supplied from glass significantly enhances both carrier density and lifetime. This is consistent with previous studies as well as earlier discussion, where Na plays important roles in the defect passivation and thereby increases V OC and J SC . However, variations in the carrier density and lifetime are less pronounced, in the case of further Na incorporation using the Na layers, apparently to be saturated.…”
Section: Resultssupporting
confidence: 93%
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“…Na diffusion supplied from glass significantly enhances both carrier density and lifetime. This is consistent with previous studies as well as earlier discussion, where Na plays important roles in the defect passivation and thereby increases V OC and J SC . However, variations in the carrier density and lifetime are less pronounced, in the case of further Na incorporation using the Na layers, apparently to be saturated.…”
Section: Resultssupporting
confidence: 93%
“…Following 20‐nm Na layer incorporation, the creation of nanometer‐/micrometer‐scale voids is observed at the CIGSS/Mo interface. Furthermore, we found that the CIGSS crystal size is gradually reduced in proximity to the Mo layer after Na incorporation, which is similar with previous reports . For quantitative analysis on the voids, we intentionally decapped the CIGSS layer from the Mo layer and measured the surface FE‐SEM images on the CIGSS layer of the decapped side as described in Figure C,D.…”
Section: Resultssupporting
confidence: 87%
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