2019
DOI: 10.1109/ted.2019.2926931
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Modeling of Total Ionizing Dose Degradation on 180-nm n-MOSFETs Using BSIM3

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Cited by 15 publications
(1 citation statement)
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“…The space radiation environment especially at Low Earth Orbit is populated with a trapped particle at Van Allen Belts, galactic cosmic ray, and other radiation from the sun. Among those particles are protons and electrons radiation, which may cause total ionizing dose (TID), displacement damage (DD), single event effect (SEE) and others, imposing the space mission in LEO at risk [35]. The electron radiation at LEO is estimated to be ranged from 100 Kev -1 Mev [28].…”
Section: B Irradiation Process and Measurement Experimental Setupmentioning
confidence: 99%
“…The space radiation environment especially at Low Earth Orbit is populated with a trapped particle at Van Allen Belts, galactic cosmic ray, and other radiation from the sun. Among those particles are protons and electrons radiation, which may cause total ionizing dose (TID), displacement damage (DD), single event effect (SEE) and others, imposing the space mission in LEO at risk [35]. The electron radiation at LEO is estimated to be ranged from 100 Kev -1 Mev [28].…”
Section: B Irradiation Process and Measurement Experimental Setupmentioning
confidence: 99%